TY  - BOOK
AU  - Swingler, J.
TI  - Reliability characterisation of electrical and electronic systems
SN  - 9781782422211
U1  - 621.381 SWI 
PY  - 2015///
CY  - Amsterdam
PB  - Elsevier/Academic Press
KW  - Reliability
KW  - stupidity
KW  - Physics-of-failure (PoF)
KW  - electrical and electronic
KW  - discrete electronic
KW  - E-Books
N1  - 1 - Introduction,; http://www.sciencedirect.com/science/article/pii/B9781782422211000010; 2 - Reliability and stupidity: mistakes in reliability engineering and how to avoid them; http://www.sciencedirect.com/science/article/pii/B9781782422211000022; 3 - Physics-of-failure (PoF) methodology for electronic reliability; http://www.sciencedirect.com/science/article/pii/B9781782422211000034; 4 - Modern instruments for characterizing degradation in electrical and electronic equipment; http://www.sciencedirect.com/science/article/pii/B9781782422211000046; 5 - Reliability building of discrete electronic components; http://www.sciencedirect.com/science/article/pii/B9781782422211000058; 6 - Reliability of optoelectronics; http://www.sciencedirect.com/science/article/pii/B978178242221100006X; 7 - Reliability of silicon integrated circuits,; http://www.sciencedirect.com/science/article/pii/B9781782422211000071; 8 - Reliability of emerging nanodevices,; http://www.sciencedirect.com/science/article/pii/B9781782422211000083; 9 - Design considerations for reliable embedded systems; http://www.sciencedirect.com/science/article/pii/B9781782422211000095; 10 - Reliability approaches for automotive electronic systems,; http://www.sciencedirect.com/science/article/pii/B9781782422211000101; 11 - Reliability modeling and accelerated life testing for solar power generation systems; http://www.sciencedirect.com/science/article/pii/B9781782422211000113; Chapter 12 - Future Directions and Reliability Issues, http://www.sciencedirect.com/science/article/pii/B9780120885749000124
N2  - This book takes a holistic approach to reliability engineering for electrical and electronic systems by looking at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability for a range of devices. The text describes the reliability behavior of electrical and electronic systems. It takes an empirical scientific approach to reliability engineering to facilitate a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation. After introducing the fundamentals and background to reliability theory, the text moves on to describe the methods of reliability analysis and charactersation across a wide range of applications
UR  - http://www.sciencedirect.com/science/book/9781782422211
ER  -