TY  - BOOK
AU  - ;Birkholz, Mario.
TI  - Thin film analysis by X-ray scattering
SN  - 9783527310524
U1  - 530.4275 BIR 
PY  - 2006///
CY  - ,Weinheim 
PB  - , Wiley-VCH 
KW  - ;Thin films
KW  - ;X-ray spectroscopy
KW  - ;Röntgenstreuung
KW  - ;Dünne Schicht
KW  - ;and Thin film analysis by X-ray scattering
ER  -