TY  - DATA
AU  - "Biswas, Santosh"
AU  - "Deka, Jatindra Kumar"
TI  - Design Verification and Test of Digital VLSI Circuits: Scan Chain based Sequential Circuit Testing-1
CY  - Guwahati
PB  - Indian Insitiute of Technology
KW  - "Prof. Jatindra Kumar Deka,Dr. Santosh Biswas"
KW  - Computer Science and  Engineering
KW  - Design Verification and Test of Digital VLSI Circuits
KW  - IIT Guwahati
KW  - NPTEL
KW  - Scan Chain based Sequential Circuit Testing-1
UR  - http://video.snu.edu.in/index.php?id=7301&cat=Computer Science and  Engineering&course=Design Verification and Test of Digital VLSI Circuits&url=Phase2_Video/106103116/mod10lec02.mp4
ER  -