Ohring, Milton 1936- creator Kasprzak, Lucian. text xxu Amsterdam Elsevier/Academic Press ©2015 monographic eng

print

xxiv, 734 pages : illustrations ; 24 cm. "Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices Chapter 1 - An Overview of Electronic Devices and Their Reliability, Chapter 2 - Electronic Devices: How They Operate and Are Fabricated, Chapter 3 - Defects, Contaminants, and Yield, Chapter 4 - The Mathematics of Failure and Reliability, Chapter 5 - Mass Transport-Induced Failure, Chapter 6 - Electronic Charge-Induced Damage, Chapter 7 - Environmental Damage to Electronic Products, Chapter 8 - Packaging Materials, Processes, and Stresses, Chapter 9 - Degradation of Contacts and Package Interconnections, Chapter 10 - Degradation and Failure of Electro-Optical Materials and Devices, Chapter 11 - Characterization and Failure Analysis of Materials and Devices, Chapter 12 - Future Directions and Reliability Issues, http://www.sciencedirect.com/science/article/pii/B9780120885749000124 Milton Ohring & Lucian Kasprzak. Electronic apparatus and appliances Reliability System failures (Engineering) Packaging Materials Electronic Charge-Induced Damage E-Books 621.381 OHR 9780120885749 Global Information Systems Technology Pvt Ltd 877, Udhyog Vihar, Phase-V, Gurgaon http://www.sciencedirect.com/science/book/9780120885749 http://www.sciencedirect.com/science/book/9780120885749 160413 20160510231811.0