00532nam a2200109Ia 4500008004100000100001700041245012700058260010000185300001500285650007900300700004300379250624s9999||||xx |||||||||||||| ||und||  aKrishna Negi 0aImpact of reliability issues in CMOS-Based synaptic circuits integrated with a simplified leaky integrated and fire neuron  aShiv Nadar University, DadribDepartment of Electrical Engineering, School of Engineeringc2025  a40p.c26cm  aEngineeringElectrical EngineeringElectronics and Communication Engineering  aUnder supervision of Dr. Sonal Singhal