TY  - BOOK
AU  - Krishna Negi
AU  - Under supervision of Dr. Sonal Singhal
TI  - Impact of reliability issues in CMOS-Based synaptic circuits integrated with a simplified leaky integrated and fire neuron
PY  - 2025///
CY  - Shiv Nadar University, Dadri
PB  - Department of Electrical Engineering, School of Engineering
KW  - EngineeringElectrical EngineeringElectronics and Communication Engineering
ER  -