TY  - BOOK
AU  - Schroder,Dieter K 
TI  - Semiconductor Material and Device Characterization
SN  - 9780471739067
U1  -  621.3815 SCH 
PY  - 2006///
CY  - New York 
PB  - : Wiley, 
KW  - 	 Semiconductors
KW  - , Semiconductors -- Testing
KW  - , Semiconductors
KW  - , device characterization
KW  - , Schroder,Dieter K
KW  - and Semiconductor Material and Device Characterization
ER  -