<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[SNU Library Search for 'Provider:; SPIE']]> </title> <link> https://library.snu.edu.in/cgi-bin/koha/opac-search.pl?q=ccl=Provider%3A%3B%20SPIE&#38;sort_by=&#38;format=rss </link> <atom:link rel="self" type="application/rss+xml" href="https://library.snu.edu.in/cgi-bin/koha/opac-search.pl?q=ccl=Provider%3A%3B%20SPIE&#38;sort_by=&#38;format=rss"/> <description> <![CDATA[ Search results for 'Provider:; SPIE' at SNU Library]]> </description> <opensearch:totalResults>11</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>50</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="https://library.snu.edu.in/cgi-bin/koha/opac-search.pl?q=ccl=Provider%3A%3B%20SPIE&#38;sort_by=&#38;format=opensearchdescription"/> <opensearch:Query role="request" searchTerms="q%3Dccl%3DProvider%253A%253B%2520SPIE" startPage="" /> <item> <title> MEMS and MOEMS Technology and Applications </title> <dc:identifier>ISBN:9780819437167</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=8886</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0819437166.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Rai-Choudhury, P..<br /> Wash. : SPIE Optical Engineering Press, 2000 .<br /> xi, 520 p. ; 27 cm..<br /> 9780819437167 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=8886">Place hold on <em> MEMS and MOEMS Technology and Applications</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=8886</guid> </item> <item> <title> Metrology, inspection, and process control for microlithography XVIII 23-26 February 2004, Santa Clara, California, USA </title> <dc:identifier>ISBN:0819452882</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=40470</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0819452882.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By ;Silver, Richard M..<br /> Santa Clara :SPIE 2004 .<br /> xl,720p. :30cm..<br /> 0819452882 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=40470">Place hold on <em>Metrology, inspection, and process control for microlithography XVIII 23-26 February 2004, Santa Clara, California, USA</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=40470</guid> </item> <item> <title> Optical Engineering : Reporting on Research and Development in Optical Science and Engineering </title> <dc:identifier>ISBN:</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=40513</link> <description> <![CDATA[ <p> By O&#39;Shea, Donald C. (ed.).<br /> ; SPIE 2004 .<br /> 1006-1263 P. </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=40513">Place hold on <em>Optical Engineering</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=40513</guid> </item> <item> <title> Design and Process Integration for Microelectronic Manufacturing III : 3-4 March 2005. San Jose, California, USA. </title> <dc:identifier>ISBN:0819457361</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=41674</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0819457361.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Liebmann, Lars W..<br /> California : SPIE 2005 .<br /> xxxv, 438 p. , 30 cm..<br /> 0819457361 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=41674">Place hold on <em>Design and Process Integration for Microelectronic Manufacturing III</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=41674</guid> </item> <item> <title> Optical Engineering : February 43 Number 2 . </title> <dc:identifier>ISBN:</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=41755</link> <description> <![CDATA[ <p> By ; Shea, Donald C..<br /> Kawamoto : SPIE Digital Library 2004 .<br /> 273-524p. :28cm..<br /> </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=41755">Place hold on <em>Optical Engineering</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=41755</guid> </item> <item> <title> Optical Engineering : February 43 Number 2 . </title> <dc:identifier>ISBN:</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=41756</link> <description> <![CDATA[ <p> By ; Shea, Donald C..<br /> Kawamoto : SPIE Digital Library 2004 .<br /> 273-524p. :28cm..<br /> </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=41756">Place hold on <em>Optical Engineering</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=41756</guid> </item> <item> <title> Optical Engineering (Print) </title> <dc:identifier>ISBN:</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=42753</link> <description> <![CDATA[ <p> .-USA :SPIE 2012 .<br /> Vol.-51 No-(1,3) Jan,Mar 2012 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=42753">Place hold on <em>Optical Engineering </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=42753</guid> </item> <item> <title> Optical Engineering (Print) </title> <dc:identifier>ISBN:</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=42754</link> <description> <![CDATA[ <p> .-USA :SPIE 2012 .<br /> Vol.-51 No-(4-5) Apr-May 2012 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=42754">Place hold on <em>Optical Engineering </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=42754</guid> </item> <item> <title> Optical Engineering (Print) </title> <dc:identifier>ISBN:</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=42755</link> <description> <![CDATA[ <p> .-USA :SPIE 2012 .<br /> Vol.-51 No-(6-7) Jun-Jul 2012 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=42755">Place hold on <em>Optical Engineering </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=42755</guid> </item> <item> <title> Optical Engineering (Print) </title> <dc:identifier>ISBN:</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=42756</link> <description> <![CDATA[ <p> .-USA :SPIE 2012 .<br /> Vol.-51 No-(8-9) Aug-Sept 2012 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=42756">Place hold on <em>Optical Engineering </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=42756</guid> </item> <item> <title> Optical Engineering. ( Print) </title> <dc:identifier>ISBN:</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=42766</link> <description> <![CDATA[ <p> Washington : Spie 2012 .<br /> Vol. 51 No. (10, 12) October, Dec. 2012. </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=42766">Place hold on <em>Optical Engineering.</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=42766</guid> </item> </channel> </rss>
