<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[SNU Library Search for 'au:&quot;Fewster Paul F.&quot;']]> </title> <link> https://library.snu.edu.in/cgi-bin/koha/opac-search.pl?q=ccl=au%3A%22Fewster%20Paul%20F.%22&#38;sort_by=&#38;format=rss </link> <atom:link rel="self" type="application/rss+xml" href="https://library.snu.edu.in/cgi-bin/koha/opac-search.pl?q=ccl=au%3A%22Fewster%20Paul%20F.%22&#38;sort_by=&#38;format=rss"/> <description> <![CDATA[ Search results for 'au:&quot;Fewster Paul F.&quot;' at SNU Library]]> </description> <opensearch:totalResults>2</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>50</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="https://library.snu.edu.in/cgi-bin/koha/opac-search.pl?q=ccl=au%3A%22Fewster%20Paul%20F.%22&#38;sort_by=&#38;format=opensearchdescription"/> <opensearch:Query role="request" searchTerms="q%3Dccl%3Dau%253A%2522Fewster%2520Paul%2520F.%2522" startPage="" /> <item> <title> X-Ray Scattering From Semiconductors </title> <dc:identifier>ISBN:9781860943607</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=5107</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1860943608.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Fewster Paul F..<br /> London Imperial College Press .<br /> xiv; 299p. 9781860943607 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=5107">Place hold on <em>X-Ray Scattering From Semiconductors</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=5107</guid> </item> <item> <title> Thin film analysis by X-ray scattering. </title> <dc:identifier>ISBN:9783527310524</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=10608</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/3527310525.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By ;Birkholz, Mario. | ; Fewster,Paul F..<br /> ,Weinheim , Wiley-VCH 2006 .<br /> xxii, 356 p. ; 25 cm..<br /> 9783527310524 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=10608">Place hold on <em>Thin film analysis by X-ray scattering.</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=10608</guid> </item> </channel> </rss>
