<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[SNU Library Search for 'index-term-genre:&quot;;Microlithography&quot;']]> </title> <link> https://library.snu.edu.in/cgi-bin/koha/opac-search.pl?q=ccl=index-term-genre%3A%22%3BMicrolithography%22&#38;sort_by=&#38;format=rss </link> <atom:link rel="self" type="application/rss+xml" href="https://library.snu.edu.in/cgi-bin/koha/opac-search.pl?q=ccl=index-term-genre%3A%22%3BMicrolithography%22&#38;sort_by=&#38;format=rss"/> <description> <![CDATA[ Search results for 'index-term-genre:&quot;;Microlithography&quot;' at SNU Library]]> </description> <opensearch:totalResults>2</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>50</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="https://library.snu.edu.in/cgi-bin/koha/opac-search.pl?q=ccl=index-term-genre%3A%22%3BMicrolithography%22&#38;sort_by=&#38;format=opensearchdescription"/> <opensearch:Query role="request" searchTerms="q%3Dccl%3Dindex-term-genre%253A%2522%253BMicrolithography%2522" startPage="" /> <item> <title> Introduction to microlithography </title> <dc:identifier>ISBN:9780841228485</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=23066</link> <description> <![CDATA[ <p> By Bowden, M. J., 1943- | Thompson, L. F., 1944- | Willson, C. G. 1939-.<br /> Washington, DC American Chemical Society 1994 .<br /> xiv, 527 p. 24 cm..<br /> 9780841228485 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=23066">Place hold on <em>Introduction to microlithography</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=23066</guid> </item> <item> <title> Metrology, inspection, and process control for microlithography XVIII 23-26 February 2004, Santa Clara, California, USA </title> <dc:identifier>ISBN:0819452882</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=40470</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0819452882.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By ;Silver, Richard M..<br /> Santa Clara :SPIE 2004 .<br /> xl,720p. :30cm..<br /> 0819452882 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=40470">Place hold on <em>Metrology, inspection, and process control for microlithography XVIII 23-26 February 2004, Santa Clara, California, USA</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=40470</guid> </item> </channel> </rss>
