<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[SNU Library Search for 'index-term-genre:&quot;Computer software -- Reliability. &quot;']]> </title> <link> https://library.snu.edu.in/cgi-bin/koha/opac-search.pl?q=ccl=index-term-genre%3A%22Computer%20software%20--%20Reliability.%20%20%20%20%22&#38;sort_by=&#38;format=rss </link> <atom:link rel="self" type="application/rss+xml" href="https://library.snu.edu.in/cgi-bin/koha/opac-search.pl?q=ccl=index-term-genre%3A%22Computer%20software%20--%20Reliability.%20%20%20%20%22&#38;sort_by=&#38;format=rss"/> <description> <![CDATA[ Search results for 'index-term-genre:&quot;Computer software -- Reliability. &quot;' at SNU Library]]> </description> <opensearch:totalResults>7</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>50</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="https://library.snu.edu.in/cgi-bin/koha/opac-search.pl?q=ccl=index-term-genre%3A%22Computer%20software%20--%20Reliability.%20%20%20%20%22&#38;sort_by=&#38;format=opensearchdescription"/> <opensearch:Query role="request" searchTerms="q%3Dccl%3Dindex-term-genre%253A%2522Computer%2520software%2520--%2520Reliability.%2520%2520%2520%2520%2522" startPage="" /> <item> <title> Software reliability engineering : more reliable software, faster development and testing </title> <dc:identifier>ISBN:9780079132710</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11649</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0079132715.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Musa, John..<br /> New York : McGraw-Hill, 1999 .<br /> xv, 391 p. ; 24 cm..<br /> 9780079132710 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=11649">Place hold on <em> Software reliability engineering</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11649</guid> </item> <item> <title> Performance solutions : a practical guide to creating responsive, scalable software </title> <dc:identifier>ISBN:9780201722291</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13941</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0201722291.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Smith, Connie U | ; Williams, Lloyd G..<br /> Boston, MA : Addison-Wesley 2001 .<br /> xxxii, 510 p. ; 24 cm..<br /> 9780201722291 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=13941">Place hold on <em>Performance solutions </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13941</guid> </item> <item> <title> Software testing techniques : finding the defects that matter </title> <dc:identifier>ISBN:9781584503460</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=14543</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1584503467.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Loveland, Scott | ; Miller, Geoffrey, | ; Prewitt, Richard,.<br /> Hingham, Mass. : Charles River Media 2005 .<br /> xxii, 362 p. ; 24 cm..<br /> 9781584503460 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=14543">Place hold on <em>Software testing techniques </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=14543</guid> </item> <item> <title> Software reliability engineering : more reliable software, faster and cheaper </title> <dc:identifier>ISBN:9780070603196</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=15733</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0070603197.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Musa, John D..<br /> new delhi, india : tata mcgraw hill, 2005 .<br /> xxi, 608 p. ; 24 cm..<br /> 9780070603196 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=15733">Place hold on <em>Software reliability engineering </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=15733</guid> </item> <item> <title> Software reliability and testing </title> <dc:identifier>ISBN:9780818668524</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=15736</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0818668520.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Pham, Hoang.<br /> Los Alamitos, Calif. : IEEE Computer Society Press 1995 .<br /> vii, 135 p. ; 28 cm.<br /> 9780818668524 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=15736">Place hold on <em>Software reliability and testing</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=15736</guid> </item> <item> <title> AntiPatterns : refactoring software, architectures, and projects in crisis </title> <dc:identifier>ISBN:9780471197133</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=38467</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0471197130.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Brown, William J...[et al].<br /> New York : Wiley, 1998 .<br /> xxv, 309 p. ; 25 cm..<br /> 9780471197133 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=38467">Place hold on <em>AntiPatterns </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=38467</guid> </item> <item> <title> SOFTWARE TECHNOLOGY Challenges &amp; Oppurtunities </title> <dc:identifier>ISBN:0-07-462355-9</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=38848</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0074623559.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Rajaraman.V.<br /> New Delhi Tata McGraw-Hill Publishing Company Limited 1993 .<br /> ;xviii,161p. ;24cm..<br /> 0-07-462355-9 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=38848">Place hold on <em>SOFTWARE TECHNOLOGY</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=38848</guid> </item> </channel> </rss>
