https://library.snu.edu.in/cgi-bin/koha/opac-search.pl?q=ccl=index-term-genre%3A%22SPIE%22&sort_by=&format=rss 2 0 50 ISBN:0819452882 https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=40470 ]]> By ;Silver, Richard M..
Santa Clara :SPIE 2004 .
xl,720p. :30cm..
0819452882

]]> Place hold on Metrology, inspection, and process control for microlithography XVIII 23-26 February 2004, Santa Clara, California, USA

]]> https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=40470 ISBN:0819457361 https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=41674 ]]> By Liebmann, Lars W..
California : SPIE 2005 .
xxxv, 438 p. , 30 cm..
0819457361

]]> Place hold on Design and Process Integration for Microelectronic Manufacturing III

]]> https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=41674