<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[SNU Library Search for 'index-term-genre:&quot;Semiconductor storage devices &quot;']]> </title> <link> https://library.snu.edu.in/cgi-bin/koha/opac-search.pl?q=ccl=index-term-genre%3A%22Semiconductor%20storage%20devices%20%22&#38;sort_by=&#38;format=rss </link> <atom:link rel="self" type="application/rss+xml" href="https://library.snu.edu.in/cgi-bin/koha/opac-search.pl?q=ccl=index-term-genre%3A%22Semiconductor%20storage%20devices%20%22&#38;sort_by=&#38;format=rss"/> <description> <![CDATA[ Search results for 'index-term-genre:&quot;Semiconductor storage devices &quot;' at SNU Library]]> </description> <opensearch:totalResults>3</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>50</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="https://library.snu.edu.in/cgi-bin/koha/opac-search.pl?q=ccl=index-term-genre%3A%22Semiconductor%20storage%20devices%20%22&#38;sort_by=&#38;format=opensearchdescription"/> <opensearch:Query role="request" searchTerms="q%3Dccl%3Dindex-term-genre%253A%2522Semiconductor%2520storage%2520devices%2520%2522" startPage="" /> <item> <title> Semiconductor memories : technology, testing, and reliability </title> <dc:identifier>ISBN:9780780310001</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11215</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0780310004.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Sharma, Ashok K. | ; IEEE Solid-State Circuits Council.<br /> New York ; IEEE Press, 1997 .<br /> xii, 462 p. ; 26 cm..<br /> 9780780310001 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=11215">Place hold on <em>Semiconductor memories </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11215</guid> </item> <item> <title> VLSI memory chip design </title> <dc:identifier>ISBN:9783540678205</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13772</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/3540678204.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Kiyoo Itoh.<br /> Berlin ; New York : Springer 2001 .<br /> xi, 495 p. ; 25 cm..<br /> 9783540678205 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=13772">Place hold on <em>VLSI memory chip design</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13772</guid> </item> <item> <title> Testing semiconductor memories : theory and practice </title> <dc:identifier>ISBN:9780471925866</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=24547</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0471925861.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By A J van de Goor.<br /> Chichester ; New York : J. Wiley &amp; Sons 1991 .<br /> xxiii, 512 p. ; 24 cm..<br /> 9780471925866 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=24547">Place hold on <em>Testing semiconductor memories </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=24547</guid> </item> </channel> </rss>
