<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[SNU Library Search for 'index-term-genre:&quot;Test.&quot;']]> </title> <link> https://library.snu.edu.in/cgi-bin/koha/opac-search.pl?q=ccl=index-term-genre%3A%22Test.%22&#38;sort_by=&#38;format=rss </link> <atom:link rel="self" type="application/rss+xml" href="https://library.snu.edu.in/cgi-bin/koha/opac-search.pl?q=ccl=index-term-genre%3A%22Test.%22&#38;sort_by=&#38;format=rss"/> <description> <![CDATA[ Search results for 'index-term-genre:&quot;Test.&quot;' at SNU Library]]> </description> <opensearch:totalResults>43</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>50</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="https://library.snu.edu.in/cgi-bin/koha/opac-search.pl?q=ccl=index-term-genre%3A%22Test.%22&#38;sort_by=&#38;format=opensearchdescription"/> <opensearch:Query role="request" searchTerms="q%3Dccl%3Dindex-term-genre%253A%2522Test.%2522" startPage="" /> <item> <title> The official guide to the GRE revised general test. </title> <dc:identifier>ISBN:9781259061080</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11300</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1259061086.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Educational Testing Service..<br /> New York | New Delhi : McGraw-Hill 2012 .<br /> 563 pages ; 28 cm.<br /> 9781259061080 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=11300">Place hold on <em>The official guide to the GRE revised general test.</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11300</guid> </item> <item> <title> Software assessments, benchmarks, and best practices </title> <dc:identifier>ISBN:9780201485424</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11723</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0201485427.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Jones, Caspers.<br /> Boston ; Toronto : Addison-Wesley, 2000 .<br /> xxiii, 659 p. ; 24cm.<br /> 9780201485424 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=11723">Place hold on <em>Software assessments, benchmarks, and best practices</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11723</guid> </item> <item> <title> Beta testing for better software </title> <dc:identifier>ISBN:9780471250371</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11873</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0471250376.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Fine, Michael.<br /> New York, NY : Wiley Technology Pub., 2002 .<br /> xix, 284 p. ; 24 cm..<br /> 9780471250371 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=11873">Place hold on <em>Beta testing for better software</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11873</guid> </item> <item> <title> Software testing techniques </title> <dc:identifier>ISBN:8177222600</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11874</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/8177222600.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Beizer, Boris,.<br /> New York : Van Nostrand Reinhold, 1983 .<br /> xviii, 290 p. ; 24 cm..<br /> 8177222600 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=11874">Place hold on <em>Software testing techniques </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11874</guid> </item> <item> <title> Test driving linux : from windows to linux in 60 seconds </title> <dc:identifier>ISBN:9798173666512</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11971</link> <description> <![CDATA[ <p> By Brickner, David.<br /> Beijing ; Farnham : O&#39;Reilly, 2005 .<br /> xvii, 341 p. ; 23 cm..<br /> 9798173666512 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=11971">Place hold on <em>Test driving linux</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11971</guid> </item> <item> <title> Testing applications on the Web :test planning for Internet-based systems </title> <dc:identifier>ISBN:9780471394709</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=12500</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/047139470X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Nguyen, Hung Q..<br /> New York : Wiley, 2001 .<br /> xiv, 402 p. ; 24 cm..<br /> 9780471394709 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=12500">Place hold on <em>Testing applications on the Web </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=12500</guid> </item> <item> <title> Computer system reliability </title> <dc:identifier>ISBN:9780471276340</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13237</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0471276340.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Roy Longbottom.<br /> Chichester [Eng.] ; New York : Wiley 1980 .<br /> xxiii, 321 p. ; 24 cm..<br /> 9780471276340 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=13237">Place hold on <em>Computer system reliability</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13237</guid> </item> <item> <title> Test Process Imporovement : A practical step-by-step guide to structured testing </title> <dc:identifier>ISBN:9780201596243</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=18174</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0201596245.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Koomen, Tim | Pol, Martin.<br /> Harlow, England Addison-Wesley 1999 .<br /> xv, 215 p. 24 cm..<br /> 9780201596243 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=18174">Place hold on <em>Test Process Imporovement</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=18174</guid> </item> <item> <title> Effective GUI test automation : developing an automated GUI testing tool </title> <dc:identifier>ISBN:978078213515</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=21517</link> <description> <![CDATA[ <p> By Li, Kanglin ; | Wu, Mengqi.<br /> San Francisco, Calif. ; London : SYBEX, 2005 .<br /> xviii, 445 p. ; 23 cm..<br /> 978078213515 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=21517">Place hold on <em>Effective GUI test automation</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=21517</guid> </item> <item> <title> Test your skills in C </title> <dc:identifier>ISBN:9780070447592</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=23074</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0070447594.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Selvi, S. Thamarai; | Murugesan, R..<br /> New Delhi : Tata McGraw-Hill , 2002 .<br /> 263 p. ; 24 cm..<br /> 9780070447592 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=23074">Place hold on <em>Test your skills in C</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=23074</guid> </item> <item> <title> Test-driven development in Microsoft .NET </title> <dc:identifier>ISBN:9788178530895</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=23449</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/8178530899.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Newkirk, James; | Vorontsov, Alexei A..<br /> Redmond, Wash. : Microsoft Press, 2004 .<br /> xxi, 273 p. ; 23 cm..<br /> 9788178530895 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=23449">Place hold on <em>Test-driven development in Microsoft .NET</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=23449</guid> </item> <item> <title> Test your emotional intelligence : how to assess and boost your EQ </title> <dc:identifier>ISBN:9788175542082</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=24453</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/817554208X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Wood, Robert.<br /> London ; Sterling, VA : Kogan Page 2003 .<br /> 153 p. 21 cm.<br /> 9788175542082 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=24453">Place hold on <em>Test your emotional intelligence </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=24453</guid> </item> <item> <title> Test your financial awareness </title> <dc:identifier>ISBN:9780340782873</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=24636</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0340782870.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Hodgson, John | Institute of Management (Great Britain).<br /> London Hodder &amp; Stoughton 2000 .<br /> 93 p. ; 20 cm..<br /> 9780340782873 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=24636">Place hold on <em>Test your financial awareness</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=24636</guid> </item> <item> <title> A Complete guide to the gate Electrical Engineering </title> <dc:identifier>ISBN:9788131772836</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=39091</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/8131772837.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Trishna Knowledge System .<br /> New Delhi :Pearson Education 2013 .<br /> vi, D80. 24cm. .<br /> 9788131772836 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=39091">Place hold on <em>A Complete guide to the gate Electrical Engineering </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=39091</guid> </item> <item> <title> Rational Test Manager : User&#39;s Guide </title> <dc:identifier>ISBN:</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=39395</link> <description> <![CDATA[ <p> By Rational.<br /> USA ; Rational Software Corporation 2001 .<br /> xvi; 434 p. </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=39395">Place hold on <em>Rational Test Manager</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=39395</guid> </item> <item> <title> Test preparation guide for LOMA 280 : principles of insurance : life, health, and annuities </title> <dc:identifier>ISBN:1579742769</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=39701</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1579742769.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Appleton, Jo Ann S..<br /> Atlanta : LOMA Education and Training, ©2005. 2005 .<br /> vii, 127p. 24cm. .<br /> 1579742769 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=39701">Place hold on <em>Test preparation guide for LOMA 280 </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=39701</guid> </item> <item> <title> WinRunner Quick Test for R/3 : User&#39;s Guide </title> <dc:identifier>ISBN:</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=39962</link> <description> <![CDATA[ <p> By Mercury Interactive Corporation .<br /> .-USA :Mercury Interactive Corporation 1994 .<br /> xii,304p.;15cm. </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=39962">Place hold on <em>WinRunner Quick Test for R/3</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=39962</guid> </item> <item> <title> Mercury Quick Test Professional : New Features Guide Version 8.2 </title> <dc:identifier>ISBN:</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=40066</link> <description> <![CDATA[ <p> By Mercury .<br /> .-USA :Mercury Interactive Corporation 2004 .<br /> 138p.;15cm. </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=40066">Place hold on <em>Mercury Quick Test Professional </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=40066</guid> </item> <item> <title> Test Director :Installation Guide Version 8.0 </title> <dc:identifier>ISBN:</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=40068</link> <description> <![CDATA[ <p> By Mercury Interactive Corporation .<br /> .-USA :Mercury Interactive Corporation 2003 .<br /> 64p.;15cm. </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=40068">Place hold on <em>Test Director </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=40068</guid> </item> <item> <title> Test and Measurement : Catalog 2001 </title> <dc:identifier>ISBN:</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=40092</link> <description> <![CDATA[ <p> By Agilent Technologies.<br /> Bangalore ; Agilent Technologies 2001 .<br /> 605 p. </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=40092">Place hold on <em>Test and Measurement</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=40092</guid> </item> <item> <title> IEEE Standard Test Access Port and Boundary-Scan Architecture </title> <dc:identifier>ISBN:1559373504</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=40580</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1559373504.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By The Institute of Electrical and Electronics Engineers.<br /> .-USA : Inst of Elect &amp; Electronic 1993 .<br /> 176p.;15cm. 1559373504 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=40580">Place hold on <em>IEEE Standard Test Access Port and Boundary-Scan Architecture</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=40580</guid> </item> <item> <title> Astra Quick Test : User Guide Version 5.6 . </title> <dc:identifier>ISBN:</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=40750</link> <description> <![CDATA[ <p> By ; Mercury Interactive..<br /> Sunnyvale : Mercury Interactive Corporation 2002 .<br /> xvi,527p. :24cm..<br /> </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=40750">Place hold on <em>Astra Quick Test</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=40750</guid> </item> <item> <title> Astra Quick Test : Tutorial Version 5.6 . </title> <dc:identifier>ISBN:</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=41613</link> <description> <![CDATA[ <p> By ; Mercury Interactive..<br /> Sunnyvale : Mercury Interactive Corporation 2002 .<br /> xvi,527p. :24cm..<br /> </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=41613">Place hold on <em>Astra Quick Test</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=41613</guid> </item> <item> <title> Complete Guide to Electronic Test Equipment and Troubleshooting Techniques </title> <dc:identifier>ISBN:0706916204</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=41695</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0706916204.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Douglas-Young, John.<br /> .-Ghaziabad :Vikas Publishing House Pvt. Ltd. 1982 .<br /> 253p.;15cm. 0706916204 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=41695">Place hold on <em>Complete Guide to Electronic Test Equipment and Troubleshooting Techniques</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=41695</guid> </item> <item> <title> Test &amp; Measurement Catalog 1996. </title> <dc:identifier>ISBN:</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=41788</link> <description> <![CDATA[ <p> By ; Hewlett Packard..<br /> : HP Test &amp; Measurement Organisation 1996 .<br /> 668p. :28cm..<br /> </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=41788">Place hold on <em>Test &amp; Measurement Catalog 1996.</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=41788</guid> </item> <item> <title> How to Prepare for the CSTE Examination. </title> <dc:identifier>ISBN:</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=41829</link> <description> <![CDATA[ <p> By ; Quality Assurance Institute..<br /> Orlando : Quality Assurance Institute. 2002 .<br /> various pages. : 28cm..<br /> </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=41829">Place hold on <em>How to Prepare for the CSTE Examination.</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=41829</guid> </item> <item> <title> The Official Guide to the TOEFL test. </title> <dc:identifier>ISBN:9781259061097</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=42812</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1259061094.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Educational Testing Service..<br /> New Delhi : McGraw-Hill, 2012 .<br /> 653p. 24cm. .<br /> 9781259061097 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=42812">Place hold on <em>The Official Guide to the TOEFL test.</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=42812</guid> </item> <item> <title> High Voltage Test and Measuring Techniques </title> <dc:identifier>ISBN:9783642453519</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=44485</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/3642453511.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Hauschild, Wolfgang | Lemke, Eberhard .<br /> Germany :Springer 2014 .<br /> xxii, 505p. 24cm. .<br /> 9783642453519 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=44485">Place hold on <em>High Voltage Test and Measuring Techniques </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=44485</guid> </item> <item> <title> Gate Tutor graduate aptitude test in Engineering 2016 :Chemical Engineering </title> <dc:identifier>ISBN:9789352034277</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=45178</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9352034279.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Gupta, Nikhil | Jain, Abhinav.<br /> New Delhi :Arihant Publication 2016 .<br /> 771p. 24cm. .<br /> 9789352034277 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=45178">Place hold on <em>Gate Tutor graduate aptitude test in Engineering 2016</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=45178</guid> </item> <item> <title> 2016 gate Graduate aptitude test in Engineering :Chemical Engineering </title> <dc:identifier>ISBN:9789351445128</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=45179</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9351445127.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By G K Publication .<br /> New Delhi :G K Publication pvt. Ltd. 2016 .<br /> 22p, different pages 24cm. .<br /> 9789351445128 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=45179">Place hold on <em>2016 gate Graduate aptitude test in Engineering </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=45179</guid> </item> <item> <title> Gate 2015 (Graduate Aptitude Test in Engineering) :Civil Engineering </title> <dc:identifier>ISBN:9789351441885</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=46414</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9351441881.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By G.K. Publication ..<br /> Roorkee C L Media (P) Ltd. 2015 .<br /> Differnt Pages 24cm. .<br /> 9789351441885 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=46414">Place hold on <em>Gate 2015 (Graduate Aptitude Test in Engineering)</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=46414</guid> </item> <item> <title> GMAT Premier Program </title> <dc:identifier>ISBN:9781419552045</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=46955</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/141955204X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Kaplan .<br /> New York :Kalan Publishing House 2009 .<br /> 22, 636p. 24cm .<br /> 9781419552045 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=46955">Place hold on <em>GMAT Premier Program </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=46955</guid> </item> <item> <title> Highway Material Testing and Quality Control </title> <dc:identifier>ISBN:9789382332657</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=48364</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9382332650.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Rao, G Venkatappa | Rao, K Ramchandra | Pahari, Kausik | Rao, D V Bhavanna.<br /> New Delhi :I K International 2015 .<br /> xix,314p. 24cm. .<br /> 9789382332657 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=48364">Place hold on <em>Highway Material Testing and Quality Control</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=48364</guid> </item> <item> <title> Gate ;Electrical Engineering </title> <dc:identifier>ISBN:9789514124204</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=48492</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9514124200.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By kanodia, R K | Murolia, Ashish.<br /> Jaipur :Noida &amp; Company 2005 .<br /> Different Pages 9789514124204 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=48492">Place hold on <em>Gate </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=48492</guid> </item> <item> <title> Gate ;Electronic &amp; Communication System </title> <dc:identifier>ISBN:9789514124181</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=48493</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9514124189.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By kanodia, R K | Murolia, Ashish.<br /> Jaipur ;Noida &amp; Company 2005 .<br /> Different Pages 24cm. .<br /> 9789514124181 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=48493">Place hold on <em>Gate</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=48493</guid> </item> <item> <title> Gate :Electrical Engineering </title> <dc:identifier>ISBN:9789383643295</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=48504</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9383643293.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Singh B .<br /> Noida :Made Essy Publication 2014 .<br /> 656p. 24cm. .<br /> 9789383643295 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=48504">Place hold on <em>Gate </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=48504</guid> </item> <item> <title> How to prepare for the TOEFL Test : test of English as a foreign language </title> <dc:identifier>ISBN:8186011870</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=48685</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/8186011870.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Sharpe, Pamela J..<br /> New Delhi :Galgotia Publication 1997 .<br /> 610p. 24cm. .<br /> 8186011870 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=48685">Place hold on <em>How to prepare for the TOEFL Test </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=48685</guid> </item> <item> <title> Face 2 Face MAT ;Management Aptitude Test with 19 years (1997-2016 ) </title> <dc:identifier>ISBN:9789385980268</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=48691</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9385980262.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Sijwali, B S | Singh, Ajay .<br /> New Delhi :Arihant Publication .<br /> 632p. 24cm. .<br /> 9789385980268 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=48691">Place hold on <em>Face 2 Face MAT</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=48691</guid> </item> <item> <title> Gate :Electrical Engineering 1991-2017 </title> <dc:identifier>ISBN:</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=49099</link> <description> <![CDATA[ <p> By Kreatryx.<br /> New Delhi :Kreatryx Publication 2017 .<br /> 888p. 24cm. .<br /> </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=49099">Place hold on <em>Gate </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=49099</guid> </item> <item> <title> Gate :Electronic and Communication Engineering 1991-2017 </title> <dc:identifier>ISBN:</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=49100</link> <description> <![CDATA[ <p> By Kreatryx.<br /> New Delhi :Kreatryx Publication 2017 .<br /> 766p. 24cm. .<br /> </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=49100">Place hold on <em>Gate</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=49100</guid> </item> <item> <title> Predictably irrational : the hidden forces that shape our decisions. </title> <dc:identifier>ISBN:9780007368549</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=49699</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0007368542.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Ariely, Dan..<br /> London : Harper, 2009. 2009 .<br /> xxii, 280 pages ; 20 cm..<br /> 9780007368549 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=49699">Place hold on <em>Predictably irrational</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=49699</guid> </item> <item> <title> GATE Graduate Aptitude Test in Engineering : Civil Engineering. </title> <dc:identifier>ISBN:9789351444923</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=49720</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9351444929.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Career Launcher..<br /> Roorkee : CL Media 2016 .<br /> various pages. :29cm..<br /> 9789351444923 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=49720">Place hold on <em>GATE Graduate Aptitude Test in Engineering</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=49720</guid> </item> <item> <title> Development of solid particle erosion test RIG </title> <dc:identifier>ISBN:</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=49871</link> <description> <![CDATA[ <p> By Abhilash Shishodia | ;Aditya Kaushik | ;Yagyeshwar Singh.<br /> Dadri :Shiv Nadar University 2017 .<br /> viii,26 p. ;29 cm..<br /> </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=49871">Place hold on <em>Development of solid particle erosion test RIG</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=49871</guid> </item> </channel> </rss>
