SNU Library Search for 'su:"Test"'

Electronic Test Instruments Analog and Digital Measurements

]]> By Witte, Robert A..
New Delhi Pearson 2009 .
xvi;371p. 9788177587487

]]> Place hold on Electronic Test Instruments

Test Your Skills in C

]]> By Selvi, S. Thamarai | Murugesan, R..
New Delhi TMH 2010 .
vi;312p. 9780070145856

]]> Place hold on Test Your Skills in C

Manage Software Testing

]]> By Farrell-Vinay, Peter .
New York Auerbach Pub. 2008 .
xxiii; 573p. 9780849393839

]]> Place hold on Manage Software Testing

Final Test The Battle for Adequacy in America's Schools

]]> By Schrag, Peter.
New York The New Press 2003 .
xxii;310p. 9781595580269

]]> Place hold on Final Test

How to Prepare for Logical Reasoning for the CAT : Common Admission Test

]]> By Sharma, Arun.
New Delhi TMH 2012 .
xv, Various pages 9781259003868 | 9789352602230

]]> Place hold on How to Prepare for Logical Reasoning for the CAT

How to Prepare for Quantitative Aptitude for the CAT : Common Admission Test

]]> By Sharma, Arun.
New Delhi TMH 2012 .
xiv, 639p. | xxix, 825p. 24cm. .
9781259027017 | 9789352602247

]]> Place hold on How to Prepare for Quantitative Aptitude for the CAT

Digital systems testing and testable design

]]> By Abramovici, Miron | ; Breuer, Melvin A. | ; Friedman, Arthur D..
New Jersey. : IEEE, Wiley Interscience., 1990 .
xviii, 652 p. ; 25 cm..
9780780310629

]]> Place hold on Digital systems testing and testable design

GATE : Electrical and Electronics Communication Engineering

]]> By Rai, Harish C. | ; Pankaj.
New Delhi : Galgotia Publications Pvt. Ltd., 2002 .
1091 p. ; 25 cm..
8175153695

]]> Place hold on GATE

Civil engineering : GATE

]]> By Kumar, Ajay.
New Delhi. : Arihant Publications, 2013 .
256 p. ; 28 cm..
9789350945254

]]> Place hold on Civil engineering

Electrical engineering : GATE

]]> By Juneja, Bhavin | ; Bharti, Prashant | ; Goel, Gaurav.
New Delhi. : Arihant Publications, 2013 .
1080 p. ; 29 cm..
9789 350944554

]]> Place hold on Electrical engineering

Instrumentation engineering : GATE

]]> By Gupta, Vipul | ; Mohanty, Sumit.
New Delhi : Arihant Publication., 2013 .
248 p. ; 28 cm..
9789350944585

]]> Place hold on Instrumentation engineering

Computer science and information technology : GATE (Solved paper 2013-2000)

]]> By Jain, Nitesh.
New Delhi. : Arihant Publications. 2013 .
320 p. ; 28 cm..
9789350944561

]]> Place hold on Computer science and information technology

Electronics and communication engineering : GATE (Solved paper 2013-2000)

]]> By Purbey, Manish..
New Delhi. : Arihant Publications., 2013 .
358 p. ; 27 cm..
9789350944608

]]> Place hold on Electronics and communication engineering

The official guide to the GRE revised general test.

]]> By Educational Testing Service..
New York | New Delhi : McGraw-Hill 2012 .
563 pages ; 28 cm.
9781259061080

]]> Place hold on The official guide to the GRE revised general test.

Software assessments, benchmarks, and best practices

]]> By Jones, Caspers.
Boston ; Toronto : Addison-Wesley, 2000 .
xxiii, 659 p. ; 24cm.
9780201485424

]]> Place hold on Software assessments, benchmarks, and best practices

Beta testing for better software

]]> By Fine, Michael.
New York, NY : Wiley Technology Pub., 2002 .
xix, 284 p. ; 24 cm..
9780471250371

]]> Place hold on Beta testing for better software

Software testing techniques

]]> By Beizer, Boris,.
New York : Van Nostrand Reinhold, 1983 .
xviii, 290 p. ; 24 cm..
8177222600

]]> Place hold on Software testing techniques

Test driving linux : from windows to linux in 60 seconds

By Brickner, David.
Beijing ; Farnham : O'Reilly, 2005 .
xvii, 341 p. ; 23 cm..
9798173666512

]]> Place hold on Test driving linux

Testing applications on the Web :test planning for Internet-based systems

]]> By Nguyen, Hung Q..
New York : Wiley, 2001 .
xiv, 402 p. ; 24 cm..
9780471394709

]]> Place hold on Testing applications on the Web

Computer system reliability

]]> By Roy Longbottom.
Chichester [Eng.] ; New York : Wiley 1980 .
xxiii, 321 p. ; 24 cm..
9780471276340

]]> Place hold on Computer system reliability

Test Process Imporovement : A practical step-by-step guide to structured testing

]]> By Koomen, Tim | Pol, Martin.
Harlow, England Addison-Wesley 1999 .
xv, 215 p. 24 cm..
9780201596243

]]> Place hold on Test Process Imporovement

Effective GUI test automation : developing an automated GUI testing tool

By Li, Kanglin ; | Wu, Mengqi.
San Francisco, Calif. ; London : SYBEX, 2005 .
xviii, 445 p. ; 23 cm..
978078213515

]]> Place hold on Effective GUI test automation

Test your skills in C

]]> By Selvi, S. Thamarai; | Murugesan, R..
New Delhi : Tata McGraw-Hill , 2002 .
263 p. ; 24 cm..
9780070447592

]]> Place hold on Test your skills in C

Test-driven development in Microsoft .NET

]]> By Newkirk, James; | Vorontsov, Alexei A..
Redmond, Wash. : Microsoft Press, 2004 .
xxi, 273 p. ; 23 cm..
9788178530895

]]> Place hold on Test-driven development in Microsoft .NET

Digital systems testing and testable design

]]> By Abramovici, Miron | ; Breuer, Melvin A. | ; Friedman, Arthur D..
New Jersey. : IEEE, Wiley Interscience., 1990 .
xviii, 652 p. ; 25 cm..
9780780310629

]]> Place hold on Digital systems testing and testable design

Test your emotional intelligence : how to assess and boost your EQ

]]> By Wood, Robert.
London ; Sterling, VA : Kogan Page 2003 .
153 p. 21 cm.
9788175542082

]]> Place hold on Test your emotional intelligence

Test your financial awareness

]]> By Hodgson, John | Institute of Management (Great Britain).
London Hodder & Stoughton 2000 .
93 p. ; 20 cm..
9780340782873

]]> Place hold on Test your financial awareness

Digital Signal Processing: Test for stability

By Roy, S.C. Dutta.
Delhi Indian Insitiute of Technology

]]> Place hold on Digital Signal Processing:

VLSI Circuits: writing a Test bench

By Srinivasan, S..
Madras Indian Insitiute of Technology

]]> Place hold on VLSI Circuits:

Soil Dynamics: Stresses in Soil Element,Field tests,Seismic Reflection Test

By Choudhury, Deepankar.
Bombay Indian Insitiute of Technology

]]> Place hold on Soil Dynamics:

Soil Dynamics: seismic Reflection Test,SASW Test,Laboratory and Model Tests

By Choudhury, Deepankar.
Bombay Indian Insitiute of Technology

]]> Place hold on Soil Dynamics:

Soil Dynamics: Estimation of Gmax,Modulus Reduction Curves,Variation of Damping Ratio,Cyclic Plate Load Test

By Choudhury, Deepankar.
Bombay Indian Insitiute of Technology

]]> Place hold on Soil Dynamics:

Soil Dynamics: Becker penetrometer test(BPT),Cone Penetrometer Test(CPT),SPTvBPT,SASW test

By Choudhury, Deepankar.
Bombay Indian Insitiute of Technology

]]> Place hold on Soil Dynamics:

Digital Signal Processing: Test for stability

By Roy, S.C. Dutta.
Delhi Indian Insitiute of Technology

]]> Place hold on Digital Signal Processing:

VLSI Circuits: writing a Test bench

By Srinivasan, S..
Madras Indian Insitiute of Technology

]]> Place hold on VLSI Circuits:

Soil Dynamics: Stresses in Soil Element,Field tests,Seismic Reflection Test

By Choudhury, Deepankar.
Bombay Indian Insitiute of Technology

]]> Place hold on Soil Dynamics:

Soil Dynamics: seismic Reflection Test,SASW Test,Laboratory and Model Tests

By Choudhury, Deepankar.
Bombay Indian Insitiute of Technology

]]> Place hold on Soil Dynamics:

Soil Dynamics: Estimation of Gmax,Modulus Reduction Curves,Variation of Damping Ratio,Cyclic Plate Load Test

By Choudhury, Deepankar.
Bombay Indian Insitiute of Technology

]]> Place hold on Soil Dynamics:

Soil Dynamics: Becker penetrometer test(BPT),Cone Penetrometer Test(CPT),SPTvBPT,SASW test

By Choudhury, Deepankar.
Bombay Indian Insitiute of Technology

]]> Place hold on Soil Dynamics:

Design Verification and Test of Digital VLSI Circuits: Introduction to Digital VLSI Design Flow