<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[SNU Library Search for 'su:&quot;testing&quot;']]> </title> <link> https://library.snu.edu.in/cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22testing%22&#38;sort_by=&#38;format=rss </link> <atom:link rel="self" type="application/rss+xml" href="https://library.snu.edu.in/cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22testing%22&#38;sort_by=&#38;format=rss"/> <description> <![CDATA[ Search results for 'su:&quot;testing&quot;' at SNU Library]]> </description> <opensearch:totalResults>152</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>50</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="https://library.snu.edu.in/cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22testing%22&#38;sort_by=&#38;format=opensearchdescription"/> <opensearch:Query role="request" searchTerms="q%3Dccl%3Dsu%253A%2522testing%2522" startPage="" /> <item> <title> Foundations of Software Testing </title> <dc:identifier>ISBN:9788131707951</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=693</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/8131707954.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Mathur,Aditya.P..<br /> New Delhi Pearson 2008 .<br /> xx;689p. 9788131707951 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=693">Place hold on <em>Foundations of Software Testing</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=693</guid> </item> <item> <title> Introducing Software Testing A practical guide to Getting Started </title> <dc:identifier>ISBN:9788177582437</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=1444</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/8177582437.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Tamres,Louise.<br /> New Delhi Pearson 2011 .<br /> 295p. 9788177582437 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=1444">Place hold on <em>Introducing Software Testing</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=1444</guid> </item> <item> <title> Instrumentation Measurement and Analysis </title> <dc:identifier>ISBN:9780070151277</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=1628</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/007015127X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Nakra, B. C. | Chaudhry, K. K. .<br /> New Delhi TMH 2010 .<br /> xiii; 641p. 9780070151277 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=1628">Place hold on <em>Instrumentation Measurement and Analysis</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=1628</guid> </item> <item> <title> Automated Software testing How to save time and Lower costs while raising quality </title> <dc:identifier>ISBN:9788131729816</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=1877</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/8131729818.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Dustin, Elfriede | Garrett, Thom | Gauf, Bernie.<br /> New Delhi Pearson 2010 9788131729816 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=1877">Place hold on <em>Automated Software testing</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=1877</guid> </item> <item> <title> Manage Software Testing </title> <dc:identifier>ISBN:9780849393839</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=4549</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0849393833.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Farrell-Vinay, Peter .<br /> New York Auerbach Pub. 2008 .<br /> xxiii; 573p. 9780849393839 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=4549">Place hold on <em>Manage Software Testing</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=4549</guid> </item> <item> <title> Problem Solving with C++ </title> <dc:identifier>ISBN:9788131715857</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=4863</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/813171585X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Savitch, Walter.<br /> New Delhi Pearson 2009 .<br /> xxxi;1119p. 9788131715857 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=4863">Place hold on <em>Problem Solving with C++</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=4863</guid> </item> <item> <title> Mechanical Behaviour and Testing of Materials </title> <dc:identifier>ISBN:</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=8833</link> <description> <![CDATA[ <p> By Bhargava, A. K..<br /> New Delhi : PHI Learning Private Ltd., 2011 .<br /> xxvi, 562 p. ; 24 cm..<br /> </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=8833">Place hold on <em>Mechanical Behaviour and Testing of Materials</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=8833</guid> </item> <item> <title> Digital systems testing and testable design </title> <dc:identifier>ISBN:9780780310629</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=9528</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0780310624.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Abramovici, Miron | ; Breuer, Melvin A. | ; Friedman, Arthur D..<br /> New Jersey. : IEEE, Wiley Interscience., 1990 .<br /> xviii, 652 p. ; 25 cm..<br /> 9780780310629 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=9528">Place hold on <em>Digital systems testing and testable design</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=9528</guid> </item> <item> <title> Semiconductor Material and Device Characterization </title> <dc:identifier>ISBN:9780471739067</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=9856</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0471739065.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Schroder,Dieter K .<br /> New York : Wiley, 2006 .<br /> xv, 599 p. ; 25 cm..<br /> 9780471739067 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=9856">Place hold on <em>Semiconductor Material and Device Characterization</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=9856</guid> </item> <item> <title> The boundary-scan handbook </title> <dc:identifier>ISBN:9781402074967</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11190</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1402074964.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Parker, Kenneth P..<br /> New York : Kluwer Academic, 2002 .<br /> xxvi, 288 p. ; 24 cm..<br /> 9781402074967 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=11190">Place hold on <em>The boundary-scan handbook</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11190</guid> </item> <item> <title> The official guide to the GRE revised general test. </title> <dc:identifier>ISBN:9781259061080</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11300</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1259061086.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Educational Testing Service..<br /> New York | New Delhi : McGraw-Hill 2012 .<br /> 563 pages ; 28 cm.<br /> 9781259061080 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=11300">Place hold on <em>The official guide to the GRE revised general test.</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11300</guid> </item> <item> <title> Managing the testing process :practical tools and techniques for managing hardware and software testing </title> <dc:identifier>ISBN:8126503130</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11304</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/8126503130.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Black, Rex.<br /> New York : Wiley .<br /> xxvii, 500 p. ; 24 cm..<br /> 8126503130 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=11304">Place hold on <em>Managing the testing process </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11304</guid> </item> <item> <title> Effective methods for software testing </title> <dc:identifier>ISBN:9971513455</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11310</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9971513455.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Perry William E. .<br /> New York : Wiley .<br /> xx, 812 p. 25 cm..<br /> 9971513455 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=11310">Place hold on <em>Effective methods for software testing</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11310</guid> </item> <item> <title> Testing object-oriented systems : models, patterns, and tools </title> <dc:identifier>ISBN:9780201809381</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11311</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0201809389.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Binder,Robert.<br /> : Addison-Wesley, 2000 .<br /> xlviii, 1191 p. ; 25 cm..<br /> 9780201809381 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=11311">Place hold on <em>Testing object-oriented systems </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11311</guid> </item> <item> <title> Effective methods for software testing </title> <dc:identifier>ISBN:9971513455</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11326</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9971513455.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Perry, William E..<br /> New York : Wiley, 2000 .<br /> xx, 812 p. ; 25 cm..<br /> 9971513455 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=11326">Place hold on <em>Effective methods for software testing</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11326</guid> </item> <item> <title> Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits </title> <dc:identifier>ISBN:9780792379911</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11513</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0792379918.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Michael L. Bushnell | / Vishwani D. Agrawal.<br /> New York : Kluwer Academic 2002 .<br /> xviii, 690 p. ; 24 cm..<br /> 9780792379911 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=11513">Place hold on <em>Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11513</guid> </item> <item> <title> Program design concepts with applications in COBOL </title> <dc:identifier>ISBN:0070498083</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11627</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0070498083.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Philippakis, Andreas S. | Kazmier, Leonard J .<br /> New York : McGraw-Hill, 1983 .<br /> vi, 217 p. ; 24 cm..<br /> 0070498083 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=11627">Place hold on <em>Program design concepts with applications in COBOL</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11627</guid> </item> <item> <title> Software reliability engineering : more reliable software, faster development and testing </title> <dc:identifier>ISBN:9780079132710</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11649</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0079132715.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Musa, John..<br /> New York : McGraw-Hill, 1999 .<br /> xv, 391 p. ; 24 cm..<br /> 9780079132710 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=11649">Place hold on <em> Software reliability engineering</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11649</guid> </item> <item> <title> Software testing techniques </title> <dc:identifier>ISBN:8177222600</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11874</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/8177222600.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Beizer, Boris,.<br /> New York : Van Nostrand Reinhold, 1983 .<br /> xviii, 290 p. ; 24 cm..<br /> 8177222600 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=11874">Place hold on <em>Software testing techniques </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11874</guid> </item> <item> <title> The boundary-scan handbook analog and digital </title> <dc:identifier>ISBN:0792392701</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11893</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0792392701.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Parker, Kenneth P. .<br /> Boston : Kluwer Academic Publishers, 1992 .<br /> xvi, 261 p. ; 25 cm..<br /> 0792392701 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=11893">Place hold on <em>The boundary-scan handbook analog and digital</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=11893</guid> </item> <item> <title> Managing the testing process </title> <dc:identifier>ISBN:9780735605848</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=12262</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/073560584X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Black, Rex.<br /> Redmond, WA : Microsoft Press 1999 .<br /> vi, 381 p. ; 23 cm.<br /> 9780735605848 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=12262">Place hold on <em>Managing the testing process</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=12262</guid> </item> <item> <title> A practical guide to testing object-oriented software </title> <dc:identifier>ISBN:9780201325645</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=12336</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0201325640.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By McGregor, John D. | ; Sykes, David A..<br /> Boston, Ma. : Addison-Wesley 2001 .<br /> xiv, 393 p. ; 24 cm..<br /> 9780201325645 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=12336">Place hold on <em>A practical guide to testing object-oriented software</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=12336</guid> </item> <item> <title> Testing applications on the Web :test planning for Internet-based systems </title> <dc:identifier>ISBN:9780471394709</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=12500</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/047139470X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Nguyen, Hung Q..<br /> New York : Wiley, 2001 .<br /> xiv, 402 p. ; 24 cm..<br /> 9780471394709 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=12500">Place hold on <em>Testing applications on the Web </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=12500</guid> </item> <item> <title> Practical software testing :a process-oriented approach </title> <dc:identifier>ISBN:818128089X</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=12519</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/818128089X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Burnstein, Ilene.<br /> New York : Springer, 2003 .<br /> xxi, 709 p. ; 24 cm..<br /> 818128089X </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=12519">Place hold on <em> Practical software testing </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=12519</guid> </item> <item> <title> Automated Web testing toolkit :expert methods for testing and managing Web applications </title> <dc:identifier>ISBN:9780471414353</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=12532</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0471414352.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Stottlemyer, Diane.<br /> New York : Wiley, 2001 .<br /> xviii, 285 p. ; 23 cm. .<br /> 9780471414353 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=12532">Place hold on <em>Automated Web testing toolkit </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=12532</guid> </item> <item> <title> How to break software : a practical guide to testing </title> <dc:identifier>ISBN:0201796198</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=12688</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0201796198.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Whittaker, James A..<br /> Boston : Addison Wesley, 2003 .<br /> xviii, 178 p. ; 24 cm. .<br /> 0201796198 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=12688">Place hold on <em>How to break software </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=12688</guid> </item> <item> <title> Effective methods for software testing </title> <dc:identifier>ISBN:0471060976</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=12773</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0471060976.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Perry, William.<br /> New York : Wiley, 1995 .<br /> xv, 539 p. ; 26 cm..<br /> 0471060976 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=12773">Place hold on <em>Effective methods for software testing</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=12773</guid> </item> <item> <title> Testing computer software </title> <dc:identifier>ISBN:9780471358466</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=12988</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0471358460.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Kaner, Cem | ; Falk, Jack L. | ; Nguyen, Hung Quoc.<br /> New York : Wiley 1999 .<br /> xv, 480 p. ; 24 cm..<br /> 9780471358466 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=12988">Place hold on <em>Testing computer software</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=12988</guid> </item> <item> <title> Effective methods for software testing </title> <dc:identifier>ISBN:9788126508938</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13012</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/8126508930.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Perry, William E..<br /> Indianapolis, IN : Wiley, . 2006 .<br /> xxvii, 973 p. ; 25 cm..<br /> 9788126508938 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=13012">Place hold on <em>Effective methods for software testing</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13012</guid> </item> <item> <title> The art of software testing </title> <dc:identifier>ISBN:9788126510061</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13170</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/8126510064.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Myers, Glenford J....[et al.].<br /> New Delhi : Wiley India (P) Ltd., 2004 .<br /> xv, 234 p ; 24cm.<br /> 9788126510061 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=13170">Place hold on <em>The art of software testing</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13170</guid> </item> <item> <title> Black-box testing : techniques for functional testing of software and systems </title> <dc:identifier>ISBN:9780471120940</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13241</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0471120944.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Boris Beizer.<br /> New York. : Wiley. 1995 .<br /> (xxv, 294 p.) ; 20 cm.<br /> 9780471120940 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=13241">Place hold on <em>Black-box testing </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13241</guid> </item> <item> <title> Effective methods for software testing </title> <dc:identifier>ISBN:9780471354185</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13311</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/047135418X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By William E Perry.<br /> New York : Wiley 2000 .<br /> xx, 812 p. ; 25 cm..<br /> 9780471354185 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=13311">Place hold on <em>Effective methods for software testing</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13311</guid> </item> <item> <title> Java testing and design : from unit testing to automated Web tests </title> <dc:identifier>ISBN:9780131421899</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13427</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0131421891.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Cohen, Frank.<br /> Upper Saddle River, NJ : Prentice Hall PTR 2004 .<br /> xxi, 489 p. ; 23 cm..<br /> 9780131421899 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=13427">Place hold on <em>Java testing and design </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13427</guid> </item> <item> <title> How to break software : a practical guide to testing </title> <dc:identifier>ISBN:9780201796193</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13451</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0201796198.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Whittaker, James A.<br /> Boston : Addison Wesley, 2003 .<br /> xviii, 178 p. ; 24 cm.<br /> 9780201796193 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=13451">Place hold on <em>How to break software</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13451</guid> </item> <item> <title> Effective software testing : 50 specific ways to improve your testing </title> <dc:identifier>ISBN:9788177585438</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13586</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/8177585436.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Dustin, Elfriede.<br /> New Delhi Pearson Publications .<br /> xv, 271 p. ; 24 cm..<br /> 9788177585438 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=13586">Place hold on <em> Effective software testing </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13586</guid> </item> <item> <title> Bulletproof documentation : creating quality through testing </title> <dc:identifier>ISBN:9780070096318</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13591</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0070096317.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Cady, Dorothy L.<br /> New delhi Tata McGrawhill publications .<br /> xxiii, 312 p. ; 24 cm..<br /> 9780070096318 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=13591">Place hold on <em> Bulletproof documentation </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13591</guid> </item> <item> <title> Just enough software test automation </title> <dc:identifier>ISBN:9780130084682</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13719</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0130084689.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Daniel J Mosley; | / Bruce A Posey.<br /> Upper Saddle River, NJ : Yourdon Press 2002 .<br /> xix, 260 p. ; 24 cm..<br /> 9780130084682 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=13719">Place hold on <em>Just enough software test automation</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13719</guid> </item> <item> <title> The art of testing network systems </title> <dc:identifier>ISBN:9780471132233</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13917</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0471132233.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Buchanan, Robert W..<br /> New York : Wiley Computer Pub. 1996 .<br /> xxii, 567 p. ; 25 cm..<br /> 9780471132233 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=13917">Place hold on <em>The art of testing network systems</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13917</guid> </item> <item> <title> Beta testing for better software </title> <dc:identifier>ISBN:8126503610</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13974</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/8126503610.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Fine, Michael.<br /> New York, NY : Wiley Technology Pub., 2002 .<br /> xv, 284 p. ; 24 cm..<br /> 8126503610 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=13974">Place hold on <em>Beta testing for better software</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=13974</guid> </item> <item> <title> The craft of software testing : subsystem testing including object-based and object-oriented testing </title> <dc:identifier>ISBN:9780131774117</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=14060</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0131774115.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Brian Marick.<br /> Englewood Cliffs, N.J. : PTR Prentice Hall 1995 .<br /> xxvii, 553 p. ; 25 cm..<br /> 9780131774117 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=14060">Place hold on <em>The craft of software testing </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=14060</guid> </item> <item> <title> Software testing fundamentals : methods and metrics </title> <dc:identifier>ISBN: 9780471468448</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=14087</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0471468444.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Marnie L Hutcheson.<br /> Indianapolis, Ind. : Wiley 2003 .<br /> (xxiii, 408 pages) ; 24 cm.<br /> 9780471468448 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=14087">Place hold on <em>Software testing fundamentals </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=14087</guid> </item> <item> <title> Software testing : principles and practice </title> <dc:identifier>ISBN:9788177581218</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=14096</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/817758121X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Srinivasan Desikan | / Gopalaswany Ramesh.<br /> Bangalore, India Dorling : Kindersley (India) 2006 .<br /> xviii, 486 p. ; 24 cm..<br /> 9788177581218 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=14096">Place hold on <em>Software testing </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=14096</guid> </item> <item> <title> Critical testing processes : plan, prepare, perform, perfect </title> <dc:identifier>ISBN:9780201748680</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=14100</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0201748681.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Black, Rex,.<br /> Boston : Addison-Wesley 2004 .<br /> xxxvi, 571 p. ; 24 cm..<br /> 9780201748680 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=14100">Place hold on <em>Critical testing processes </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=14100</guid> </item> <item> <title> Critical testing processes : plan, prepare, perform, perfect </title> <dc:identifier>ISBN:9788131711361</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=14273</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/8131711366.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Black, Rex.<br /> New Delhi : Dorling Kindersley (India) Pvt. Ltd., 2007 .<br /> xxxvi, 571 p. ; 24 cm..<br /> 9788131711361 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=14273">Place hold on <em>Critical testing processes </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=14273</guid> </item> <item> <title> A tester&#39;s guide to .NET programming </title> <dc:identifier>ISBN:9788181284242</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=14439</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/8181284240.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Randal Root; | / Mary Romero Sweeney.<br /> Berkeley, Caif. : Apress ; New York : Distributed by Springer-Verlag 2006 .<br /> (xxv, 606 p.) ; 22 cm.<br /> 9788181284242 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=14439">Place hold on <em>A tester&#39;s guide to .NET programming</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=14439</guid> </item> <item> <title> Software testing techniques : finding the defects that matter </title> <dc:identifier>ISBN:9781584503460</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=14543</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1584503467.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Loveland, Scott | ; Miller, Geoffrey, | ; Prewitt, Richard,.<br /> Hingham, Mass. : Charles River Media 2005 .<br /> xxii, 362 p. ; 24 cm..<br /> 9781584503460 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=14543">Place hold on <em>Software testing techniques </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=14543</guid> </item> <item> <title> Software testing techniques </title> <dc:identifier>ISBN:9780442206727</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=14814</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0442206720.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Boris Beizer.<br /> New Delhi : Dreamtech Press 2000 .<br /> xxvi, 550 p. ; 24 cm..<br /> 9780442206727 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=14814">Place hold on <em>Software testing techniques</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=14814</guid> </item> <item> <title> Software Testing : A Craftsman&#39;s Approach, Second Edition. </title> <dc:identifier>ISBN:9780849308093</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=15267</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0849308097.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Paul Jorgensen.<br /> Hoboken : Taylor and Francis 2014 .<br /> xix, 359 p. ; 26 cm..<br /> 9780849308093 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=15267">Place hold on <em>Software Testing </em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=15267</guid> </item> <item> <title> A practitioner&#39;s guide to software test design </title> <dc:identifier>ISBN:9781580537919</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=15455</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/158053791X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Lee Copeland.<br /> Boston, Mass. ; London : Artech House 2008 .<br /> xvii, 294 p. ; 24 cm..<br /> 9781580537919 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=15455">Place hold on <em>A practitioner&#39;s guide to software test design</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=15455</guid> </item> <item> <title> Calibration : the foundation for ISO 9000 and TQM </title> <dc:identifier>ISBN:8170238692</dc:identifier> <link>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=15478</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/8170238692.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Subburaj, R.<br /> New Delhi : Allied Publishers 1998 .<br /> xiv, 245 p ; 25 cm.<br /> 8170238692 </p> ]]> <![CDATA[ <p> <a href="https://library.snu.edu.in/cgi-bin/koha/opac-reserve.pl?biblionumber=15478">Place hold on <em> Calibration</em></a> </p> ]]> </description> <guid>https://library.snu.edu.in/cgi-bin/koha/opac-detail.pl?biblionumber=15478</guid> </item> </channel> </rss>
