000 00730nam a22001937a 4500
003 SNU
005 20140417141117.0
008 140417b xxu||||| |||| 00| 0 eng d
020 _a9783527310524
028 _a,Variety Books Publishers and Distributors.
_b,2/22 Ansari Road New Delhi.
_c,IM830
_d,26/3/2014
082 _a530.4275 BIR
100 _a;Birkholz, Mario.
_a; Fewster,Paul F.
245 _aThin film analysis by X-ray scattering.
_c;Mario Birkholz.
260 _a,Weinheim
_b, Wiley-VCH
_c,2006.
300 _axxii, 356 p.
_b : ill.
_c; 25 cm.
365 _b13776
655 _b;Thin films.
_b;X-ray spectroscopy.
_b;Röntgenstreuung.
_b;Dünne Schicht.
_b;and Thin film analysis by X-ray scattering.
942 _2ddc
_cBOOK
999 _c10608
_d10608