000 00797nam a22002297a 4500
003 SNU
005 20140808220937.0
008 140620b xxu||||| |||| 00| 0 eng d
020 _a9780792379911
028 _aHCL
082 _a621.395 BUS
100 _aMichael L. Bushnell
_a/ Vishwani D. Agrawal
245 _aEssentials of electronic testing for digital, memory and mixed-signal VLSI circuits
_c/ Michael L. Bushnell
260 _aNew York
_b : Kluwer Academic
_c, ©2002.
300 _axviii, 690 p.
_b : ill.
_c; 24 cm.
655 _aIntegrated circuits -- Very large scale integration -- Testing.
655 _aDigital integrated circuits -- Testing.
655 _a Mixed signal circuits -- Testing.
655 _aMichael L. Bushnell
655 _aCommunication
942 _2ddc
_cHCL
999 _c11513
_d11513