| 000 | 00617nam a22001697a 4500 | ||
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| 003 | SNU | ||
| 005 | 20160108105259.0 | ||
| 008 | 150819b xxu||||| |||| 00| 0 eng d | ||
| 100 | _aGupta, Manish Kumar | ||
| 245 |
_aTo identify potential scan chain failure due to dynamic voltage drop. _c\Manish Kumar Gupta |
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| 260 |
_a.-Shiv Nadar University,Dadri _b:Department of Electrical Engineering _c,May,2015 |
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| 300 |
_a83 p. _b, Hard Bound |
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| 440 |
_a.-(M.Tech Electrical Engineering) _n,Under Supervision of Dr. Ramesh Vaddi |
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| 655 | _aProject Report | ||
| 655 | _a Electrical Engineering | ||
| 942 |
_2ddc _cPR |
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| 999 |
_c45001 _d45001 |
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