| 000 | 01180nam a22002297a 4500 | ||
|---|---|---|---|
| 999 |
_c55977 _d55977 |
||
| 005 | 20191212152844.0 | ||
| 008 | 191121b ||||| |||| 00| 0 eng d | ||
| 020 | _a9783662142189 | ||
| 028 |
_aInternational Book Distributors _bDarya Ganj, New Delhi-110002 _c114594 _d07.11.2019 |
||
| 082 |
_223 _a620 TOL |
||
| 100 | _aMetin Tolan | ||
| 245 |
_aX-Ray Scattering from Soft-Matter Thin Films Materials Science and Basic Research _cMetin Tolan |
||
| 260 |
_aBerlin _bSpringer Berlin _c2013 |
||
| 300 |
_a197pages _c26cm |
||
| 365 | _b7206 | ||
| 505 | _aReflectivity of x-rays from surfaces.- Reflectivity experiments.- Advanced analysis techniques.- Statistical description of interfaces.- Off-specular scattering.- X-ray scattering with coherent radiation.- Closing remarks. | ||
| 520 | _aThe properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science. X-ray scattering under grazing angles is the only tool to investigating these materials on atomic and mesoscopic length scales | ||
| 650 | _aXray | ||
| 650 | _aTechnology | ||
| 650 | _aMaterial Science | ||
| 942 | _cBOOK | ||