| 000 | 01004nam a22002177a 4500 | ||
|---|---|---|---|
| 003 | SNU | ||
| 005 | 20140811193032.0 | ||
| 008 | 130717b xxu||||| |||| 00| 0 eng d | ||
| 020 | _a9780780310629 | ||
| 028 |
_aGlobal Alliance Book Distributors _bA-312, Nanad Nikunj Meerut Road, Ghaziabad, U.P.-201001 _cInvoice No. 399 _d13/07/2013 |
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| 028 | _aHCL | ||
| 082 | _a621.3815 ABR | ||
| 100 |
_a Abramovici, Miron _a; Breuer, Melvin A. _a; Friedman, Arthur D. |
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| 245 |
_aDigital systems testing and testable design _c/ Miron Abramovici; Melvin A Breuer; Arthur D Friedman |
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| 250 | _brevised printing. | ||
| 260 |
_aNew Jersey. _b: IEEE, Wiley Interscience., _c1990. |
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| 300 |
_axviii, 652 p. _b: ill. _c; 25 cm. |
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| 365 | _f10821 | ||
| 655 |
_bElectrical engineering. _b, Digital integrated circuits -- Testing. _b. Digital integrated circuits -- Design and construction. _b, Test functional. _b, Abramovici, Miron _b, IEEE. _b, and Digital systems testing and testable design. |
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| 942 |
_2ddc _cBOOK |
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| 999 |
_c9528 _d9528 |
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