| 000 | 00775nam a22001937a 4500 | ||
|---|---|---|---|
| 003 | SNU | ||
| 005 | 20130920100544.0 | ||
| 008 | 130920b xxu||||| |||| 00| 0 eng d | ||
| 020 | _a9780471739067 | ||
| 028 |
_aAllied Publishers Pvt. Ltd. _b1/13-14, Asif Ali Road, New Delhi-110 _cDE/2013/CR/000711 _d05/09/2013 |
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| 082 | _a 621.3815 SCH | ||
| 100 | _aSchroder,Dieter K | ||
| 245 |
_aSemiconductor Material and Device Characterization _c/Dieter K Schroder. |
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| 260 |
_aNew York _b: Wiley, _c2006. |
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| 300 |
_axv, 599 p. _b : ill. _c ; 25 cm. |
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| 365 | _f12849 | ||
| 655 |
_b Semiconductors. _b, Semiconductors -- Testing. _b, Semiconductors _b, device characterization. _b, Schroder,Dieter K _band Semiconductor Material and Device Characterization |
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| 942 |
_2ddc _cBOOK |
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| 999 |
_c9856 _d9856 |
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