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Java/J2EE Testing Patterns Thomas, Jon ; Young, Matthew

By:

Thomas, Jon ; Young, Matthew

Material type: Text

Text

TextPublisher number: HCLPublication details: New Delhi Wiley Dreamtech India (P) Ltd. 2004Description: ;xv, 400p. :ill ;24cmISBN:

81-265-0555-9

Genre/Form:

JAVA

DDC classification:

005.133 THO

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Holdings ( 1 )
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Holdings
Item type	Current library	Call number	Status	Barcode
HCL Collection	SNU LIBRARY	005.133 THO (Browse shelf(Opens below))	Withdrawn	H12541

Total holds: 0

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