Thin film analysis by X-ray scattering.
Birkholz, Mario. ; Fewster,Paul F.
Thin film analysis by X-ray scattering. Mario Birkholz. - ,Weinheim , Wiley-VCH ,2006. - xxii, 356 p. : ill. ; 25 cm.
9783527310524
,Variety Books Publishers and Distributors. ,2/22 Ansari Road New Delhi.
--;Thin films.--;X-ray spectroscopy.--;Röntgenstreuung.--;Dünne Schicht.--;and Thin film analysis by X-ray scattering.
530.4275 BIR
Thin film analysis by X-ray scattering. Mario Birkholz. - ,Weinheim , Wiley-VCH ,2006. - xxii, 356 p. : ill. ; 25 cm.
9783527310524
,Variety Books Publishers and Distributors. ,2/22 Ansari Road New Delhi.
--;Thin films.--;X-ray spectroscopy.--;Röntgenstreuung.--;Dünne Schicht.--;and Thin film analysis by X-ray scattering.
530.4275 BIR
