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IEEE Standard Test Access Port and Boundary-Scan Architecture

The Institute of Electrical and Electronics Engineers

IEEE Standard Test Access Port and Boundary-Scan Architecture /The Institute of Electrical and Electronics Engineers - USA : Inst of Elect & Electronic ,@1993 - 176p.;15cm. Softocver

ISBN: 1559373504

Index Terms--Genre/Form:
Architecture
Standard Test Access Port

Dewey Class. No.: 621.38152 IEE

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