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To identify potential scan chain failure due to dynamic voltage drop.

Gupta, Manish Kumar

To identify potential scan chain failure due to dynamic voltage drop. \Manish Kumar Gupta - Shiv Nadar University,Dadri :Department of Electrical Engineering ,May,2015 - 83 p. , Hard Bound - (M.Tech Electrical Engineering) ,Under Supervision of Dr. Ramesh Vaddi .

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Electrical Engineering

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