Digital systems testing and testable design
Abramovici, Miron ; Breuer, Melvin A. ; Friedman, Arthur D.
Digital systems testing and testable design / Miron Abramovici; Melvin A Breuer; Arthur D Friedman - revised printing. - New Jersey. : IEEE, Wiley Interscience., 1990. - xviii, 652 p. : ill. ; 25 cm.
9780780310629
Global Alliance Book Distributors A-312, Nanad Nikunj Meerut Road, Ghaziabad, U.P.-201001 HCL
--Electrical engineering.--, Digital integrated circuits -- Testing.--. Digital integrated circuits -- Design and construction.--, Test functional.--, Abramovici, Miron --, IEEE.--, and Digital systems testing and testable design.
621.3815 ABR
Digital systems testing and testable design / Miron Abramovici; Melvin A Breuer; Arthur D Friedman - revised printing. - New Jersey. : IEEE, Wiley Interscience., 1990. - xviii, 652 p. : ill. ; 25 cm.
9780780310629
Global Alliance Book Distributors A-312, Nanad Nikunj Meerut Road, Ghaziabad, U.P.-201001 HCL
--Electrical engineering.--, Digital integrated circuits -- Testing.--. Digital integrated circuits -- Design and construction.--, Test functional.--, Abramovici, Miron --, IEEE.--, and Digital systems testing and testable design.
621.3815 ABR
