Scanning Probe Microscopy in Industrial Applications : (Record no. 60174)

MARC details
000 -LEADER
fixed length control field 02991nam a22002417a 4500
003 - CONTROL NUMBER IDENTIFIER
control field SNU
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20230414200317.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
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020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781118723142
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781118288238
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Edition number 1st
Classification number 620.1127 YAB
245 ## - TITLE STATEMENT
Title Scanning Probe Microscopy in Industrial Applications :
Remainder of title Nanomechanical Characterization /
Statement of responsibility, etc edited by Dalia G. Yablon
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc Hoboken, New Jersey :
Name of publisher, distributor, etc John Wiley & Sons, Incorporated,
Date of publication, distribution, etc 2013.
300 ## - PHYSICAL DESCRIPTION
Extent xix, 363 p.
520 ## - SUMMARY, ETC.
Summary, etc Describes new state-of-the-science tools and their contribution to industrial R&D With contributions from leading international experts in the field, this book explains how scanning probe microscopy is used in industry, resulting in improved product formulation, enhanced processes, better quality control and assurance, and new business opportunities. Readers will learn about the use of scanning probe microscopy to support R&D efforts in the semiconductor, chemical, personal care product, biomaterial, pharmaceutical, and food science industries, among others. Scanning Probe Microscopy in Industrial Applications emphasizes nanomechanical characterization using scanning probe microscopy. The first half of the book is dedicated to a general overview of nanomechanical characterization methods, offering a complete practical tutorial for readers who are new to the topic. Several chapters include worked examples of useful calculations such as using Hertz mechanics with and without adhesion to model a contact, step-by-step instructions for simulations to guide cantilever selection for an experiment, and data analysis procedures for dynamic contact experiments. The second half of the book describes applications of nanomechanical characterization in industry, including: New formulation development for pharmaceuticals Measurement of critical dimensions and thin dielectric films in the semiconductor industry Effect of humidity and temperature on biomaterials Characterization of polymer blends to guide product formulation in the chemicals sector Unraveling links between food structure and function in the food industry Contributions are based on the authors' thorough review of the current literature as well as their own firsthand experience applying scanning probe microscopy to solve industrial R&D problems. By explaining the fundamentals before advancing to applications, Scanning Probe Microscopy in Industrial Applications offers a complete treatise that is accessible to both novices and professionals. All readers will discover how to apply scanning probe microscopy to build and enhance their R&D efforts.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Materials -- Microscopy
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Scanning probe microscopy -- Industrial applications
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Nanomechanical Characterization
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Electron Microscopes & Microscopy
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Yablon, Dalia G.
856 ## - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier https://ebookcentral.proquest.com/lib/snuin/detail.action?docID=1483726
Public note eBook
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Dewey Decimal Classification
Koha item type Electronic Resources (E-Books)
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Home library Current library Shelving location Date acquired Source of acquisition Total Checkouts Full call number Barcode Date last seen Uniform Resource Identifier Price effective from Koha item type Public note
    Dewey Decimal Classification   Not For Loan SNU LIBRARY SNU LIBRARY Reference 14/04/2023 ProQuest   620.1127 YAB ER126 14/04/2023 https://ebookcentral.proquest.com/lib/snuin/detail.action?docID=1483726 14/04/2023 Electronic Resources (E-Books) eBook
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