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Impact of reliability issues in CMOS-Based synaptic circuits integrated with a simplified leaky integrated and fire neuron (Record no. 63884)

MARC details
000 -LEADER
fixed length control field	00580nam a2200133Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field	250624s9999\|\|\|\|xx \|\|\|\|\|\|\|\|\|\|\|\|\|\| \|\|und\|\|
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name	Krishna Negi
245 #0 - TITLE STATEMENT
Title	Impact of reliability issues in CMOS-Based synaptic circuits integrated with a simplified leaky integrated and fire neuron
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc	Shiv Nadar University, Dadri
Name of publisher, distributor, etc	Department of Electrical Engineering, School of Engineering
Date of publication, distribution, etc	2025
300 ## - PHYSICAL DESCRIPTION
Extent	40p.
Dimensions	26cm
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element	EngineeringElectrical EngineeringElectronics and Communication Engineering
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name	Under supervision of Dr. Sonal Singhal
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type	Project Report

Holdings
Withdrawn status	Lost status	Damaged status	Not for loan	Home library	Current library	Date acquired	Total Checkouts	Barcode	Date last seen	Price effective from	Koha item type	Public note
			Not For Loan	SNU LIBRARY	SNU LIBRARY	24/06/2025		TH1038	24/06/2025	24/06/2025	Project Report	UG Project Report 2025