Image from Amazon.com
Image from Google Jackets
Semiconductor memories : technology, testing, and reliability
Material type:
TextPublisher number: HCLPublication details: New York ; IEEE Press, ©1997.Description: xii, 462 p. ; 26 cmISBN: - 9780780310001
- 621.39732 SHA
| Item type | Current library | Call number | Status | Barcode | |
|---|---|---|---|---|---|
HCL Collection
|
SNU LIBRARY | 621.39732 SHA (Browse shelf(Opens below)) | Available | H7258 | |
|
HCL Collection
|
SNU LIBRARY | 621.39732 SHA (Browse shelf(Opens below)) | Available | H8 |
Total holds: 0
There are no comments on this title.
Log in to your account to post a comment.
