X-Ray Scattering from Soft-Matter Thin Films Materials Science and Basic Research Metin Tolan
Material type:
TextPublisher number: International Book Distributors | Darya Ganj, New Delhi-110002Publication details: Berlin Springer Berlin 2013Description: 197pages 26cmISBN: - 9783662142189
- 23 620 TOL
| Item type | Current library | Call number | Status | Date due | Barcode | |
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Books
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SNU LIBRARY | 620 TOL (Browse shelf(Opens below)) | Checked out to Sajal Kumar Ghosh (20500246) | 28/04/2024 00:00 | 27068 |
Reflectivity of x-rays from surfaces.- Reflectivity experiments.- Advanced analysis techniques.- Statistical description of interfaces.- Off-specular scattering.- X-ray scattering with coherent radiation.- Closing remarks.
The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science. X-ray scattering under grazing angles is the only tool to investigating these materials on atomic and mesoscopic length scales
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