Your search returned 197 results.

Sort
Results
141.
Image from Google Jackets
Design Verification and Test of Digital VLSI Circuits: Functional and Structural Testing / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Functional and Structural Testing
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

142.
Image from Google Jackets
Design Verification and Test of Digital VLSI Circuits: Fault Equivalence / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Fault Equivalence
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

143.
Image from Google Jackets
Design Verification and Test of Digital VLSI Circuits: Fault Simulation-1 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Fault Simulation-1
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

144.
Image from Google Jackets
Design Verification and Test of Digital VLSI Circuits: Fault Simulation-2 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Fault Simulation-2
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

145.
Image from Google Jackets
Design Verification and Test of Digital VLSI Circuits: Fault Simulation-3 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Fault Simulation-3
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

146.
Image from Google Jackets
Design Verification and Test of Digital VLSI Circuits: Testability Measures (SCOAP) / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Testability Measures (SCOAP)
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

147.
Image from Google Jackets
Design Verification and Test of Digital VLSI Circuits: Introduction to Automatic Test Pattern Generation (ATPG) and ATPG Algebras / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Introduction to Automatic Test Pattern Generation (ATPG) and ATPG Algebras
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

148.
Image from Google Jackets
Design Verification and Test of Digital VLSI Circuits: D-Algorithm-1 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering D-Algorithm-1
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

149.
Image from Google Jackets
Design Verification and Test of Digital VLSI Circuits: D-Algorithm-2 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering D-Algorithm-2
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

150.
Image from Google Jackets
Design Verification and Test of Digital VLSI Circuits: ATPG for Synchronous Sequential Circuits / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering ATPG for Synchronous Sequential Circuits
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

151.
Image from Google Jackets
Design Verification and Test of Digital VLSI Circuits: Scan Chain based Sequential Circuit Testing-1 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Scan Chain based Sequential Circuit Testing-1
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

152.
Image from Google Jackets
Design Verification and Test of Digital VLSI Circuits: Scan Chain based Sequential Circuit Testing-2 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Scan Chain based Sequential Circuit Testing-2
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

153.
Image from Google Jackets
Design Verification and Test of Digital VLSI Circuits: Built in Self Test-1 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Built in Self Test-1
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

154.
Image from Google Jackets
Design Verification and Test of Digital VLSI Circuits: Built in Self Test-2 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Built in Self Test-2
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

155.
Image from Google Jackets
Design Verification and Test of Digital VLSI Circuits: Memory Testing-1 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Memory Testing-1
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

156.
Image from Google Jackets
Design Verification and Test of Digital VLSI Circuits: Memory Testing-2 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Memory Testing-2
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

157.
Image from Google Jackets
Low Power VLSI Circuits And Systems: Inroduction and Course outline / Ajit Pal by Series: NPTEL Lecture Series. Computer Science and Engineering Inroduction and Course outline
Material type: Computer file Computer file; Format: electronic
Publication details: Kharagpur Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

158.
Image from Google Jackets
Low Power VLSI Circuits And Systems: MOS Transistors / Ajit Pal by Series: NPTEL Lecture Series. Computer Science and Engineering MOS Transistors
Material type: Computer file Computer file; Format: electronic
Publication details: Kharagpur Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

159.
Image from Google Jackets
Low Power VLSI Circuits And Systems: MOS Transistors / Ajit Pal by Series: NPTEL Lecture Series. Computer Science and Engineering MOS Transistors
Material type: Computer file Computer file; Format: electronic
Publication details: Kharagpur Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

160.
Image from Google Jackets
Low Power VLSI Circuits And Systems: MOS Transistors / Ajit Pal by Series: NPTEL Lecture Series. Computer Science and Engineering MOS Transistors
Material type: Computer file Computer file; Format: electronic
Publication details: Kharagpur Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).


© Copyright Shiv Nadar University 2012. All Rights Reserved.  Disclaimer |  Sitemap
The Shiv Nadar University has been established under U.P. Act No 12 of 2011. Shiv Nadar University is UGC Approved.