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1881.
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Design Verification and Test of Digital VLSI Circuits: Fault Equivalence / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Fault Equivalence
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

1882.
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Design Verification and Test of Digital VLSI Circuits: Fault Simulation-1 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Fault Simulation-1
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

1883.
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Design Verification and Test of Digital VLSI Circuits: Fault Simulation-2 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Fault Simulation-2
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

1884.
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Design Verification and Test of Digital VLSI Circuits: Fault Simulation-3 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Fault Simulation-3
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

1885.
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Design Verification and Test of Digital VLSI Circuits: Testability Measures (SCOAP) / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Testability Measures (SCOAP)
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

1886.
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Design Verification and Test of Digital VLSI Circuits: Introduction to Automatic Test Pattern Generation (ATPG) and ATPG Algebras / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Introduction to Automatic Test Pattern Generation (ATPG) and ATPG Algebras
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

1887.
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Design Verification and Test of Digital VLSI Circuits: D-Algorithm-1 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering D-Algorithm-1
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

1888.
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Design Verification and Test of Digital VLSI Circuits: D-Algorithm-2 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering D-Algorithm-2
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

1889.
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Design Verification and Test of Digital VLSI Circuits: ATPG for Synchronous Sequential Circuits / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering ATPG for Synchronous Sequential Circuits
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

1890.
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Design Verification and Test of Digital VLSI Circuits: Scan Chain based Sequential Circuit Testing-1 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Scan Chain based Sequential Circuit Testing-1
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

1891.
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Design Verification and Test of Digital VLSI Circuits: Scan Chain based Sequential Circuit Testing-2 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Scan Chain based Sequential Circuit Testing-2
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

1892.
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Design Verification and Test of Digital VLSI Circuits: Built in Self Test-1 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Built in Self Test-1
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

1893.
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Design Verification and Test of Digital VLSI Circuits: Built in Self Test-2 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Built in Self Test-2
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

1894.
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Design Verification and Test of Digital VLSI Circuits: Memory Testing-1 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Memory Testing-1
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

1895.
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Design Verification and Test of Digital VLSI Circuits: Memory Testing-2 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Memory Testing-2
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

1896.
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Low Power VLSI Circuits And Systems: Variation Tolerant Design / Ajit Pal by Series: NPTEL Lecture Series. Computer Science and Engineering Variation Tolerant Design
Material type: Computer file Computer file; Format: electronic
Publication details: Kharagpur Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

1897.
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Low Power VLSI Circuits And Systems: Battery Driven System Design / Ajit Pal by Series: NPTEL Lecture Series. Computer Science and Engineering Battery Driven System Design
Material type: Computer file Computer file; Format: electronic
Publication details: Kharagpur Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

1898.
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Performance Evaluation of Computer Systems: Confidence interval for propotions and introduction to experimental design / Krishna Moorthy Sivalingam by Series: NPTEL Lecture Series. Computer Science and Engineering Confidence interval for propotions and introduction to experimental design
Material type: Computer file Computer file; Format: electronic
Publication details: Madras Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

1899.
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Performance Evaluation of Computer Systems: 2K Factorial design / Krishna Moorthy Sivalingam by Series: NPTEL Lecture Series. Computer Science and Engineering 2K Factorial design
Material type: Computer file Computer file; Format: electronic
Publication details: Madras Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

1900.
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Performance Evaluation of Computer Systems: 2k r fractional Design and 2k p fractional Design / Krishna Moorthy Sivalingam by Series: NPTEL Lecture Series. Computer Science and Engineering 2k r fractional Design and 2k p fractional Design
Material type: Computer file Computer file; Format: electronic
Publication details: Madras Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).


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