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21.
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Transmission Lines and EM Waves: Fourier Tranform relation between current and radiation pattern / R.K. Shevgaonkar by Series: NPTEL Lecture Series | . Electronics And Communication Engineering | . Fourier Tranform relation between current and radiation pattern
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Bombay ; Indian Insitiute of Technology
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22.
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Digital Circuits and Systems: Pattern Detector / S. Srinivasan by Series: NPTEL Lecture Series | . Electronics And Communication Engineering | . Pattern Detector
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Madras ; Indian Insitiute of Technology
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23.
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Multiphase Flow: Flow Pattern Maps Fascinating Taylor Bubbles / Gargi Das and P.K. Das by Series: NPTEL Lecture Series | . Chemical Engineering | . Flow Pattern Maps Fascinating Taylor Bubbles
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Kharagpur ; Indian Insitiute of Technology
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24.
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Transmission Lines and EM Waves: Fourier Tranform relation between current and radiation pattern / R.K. Shevgaonkar by Series: NPTEL Lecture Series. Electronics And Communication Engineering Fourier Tranform relation between current and radiation pattern
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Bombay Indian Insitiute of Technology
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25.
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Digital Circuits and Systems: Pattern Detector / S. Srinivasan by Series: NPTEL Lecture Series. Electronics And Communication Engineering Pattern Detector
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Madras Indian Insitiute of Technology
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26.
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Multiphase Flow: Flow Pattern Maps Fascinating Taylor Bubbles / Gargi Das and P.K. Das by Series: NPTEL Lecture Series. Chemical Engineering Flow Pattern Maps Fascinating Taylor Bubbles
Material type: Computer file Computer file; Format: electronic
Publication details: Kharagpur Indian Insitiute of Technology
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27.
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Design Verification and Test of Digital VLSI Circuits: Introduction to Automatic Test Pattern Generation (ATPG) and ATPG Algebras / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Introduction to Automatic Test Pattern Generation (ATPG) and ATPG Algebras
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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28.
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An Introduction to Electronics Systems Packaging: Through-hole manufacture process steps; Panel and pattern plating methods / G.V. Mahesh by Series: NPTEL Lecture Series. Electrical Engineering Through-hole manufacture process steps; Panel and pattern plating methods
Material type: Computer file Computer file; Format: electronic
Publication details: Bangalore Indian Insitiute of Science
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29.
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Advanced Manufacturing Processes: Evaporative Pattern Casting Process(EPC) / A.K. Sharma by Series: NPTEL Lecture Series. Mechanical Engineering Evaporative Pattern Casting Process(EPC)
Material type: Computer file Computer file; Format: electronic
Publication details: Roorkee Indian Insitiute of Technology
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30.
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Pattern Recognition: Introduction to Statistical Pattern Recognition / P.S. Sastry by Series: NPTEL Lecture Series. Electronics And Communication Engineering Introduction to Statistical Pattern Recognition
Material type: Computer file Computer file; Format: electronic
Publication details: Bangalore Indian Insitiute of Science
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31.
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Pattern Recognition: Overview of Pattern Classifiers / P.S. Sastry by Series: NPTEL Lecture Series. Electronics And Communication Engineering Overview of Pattern Classifiers
Material type: Computer file Computer file; Format: electronic
Publication details: Bangalore Indian Insitiute of Science
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32.
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Pattern Recognition: The Bayes Classifier for minimizing Risk / P.S. Sastry by Series: NPTEL Lecture Series. Electronics And Communication Engineering The Bayes Classifier for minimizing Risk
Material type: Computer file Computer file; Format: electronic
Publication details: Bangalore Indian Insitiute of Science
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33.
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Pattern Recognition: Estimating Bayes Error; Minimax and Neymann-Pearson classifiers / P.S. Sastry by Series: NPTEL Lecture Series. Electronics And Communication Engineering Estimating Bayes Error; Minimax and Neymann-Pearson classifiers
Material type: Computer file Computer file; Format: electronic
Publication details: Bangalore Indian Insitiute of Science
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34.
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Pattern Recognition: Implementing Bayes Classifier; Estimation of Class Conditional Densities / P.S. Sastry by Series: NPTEL Lecture Series. Electronics And Communication Engineering Implementing Bayes Classifier; Estimation of Class Conditional Densities
Material type: Computer file Computer file; Format: electronic
Publication details: Bangalore Indian Insitiute of Science
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35.
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Pattern Recognition: Maximum Likelihood estimation of different densities / P.S. Sastry by Series: NPTEL Lecture Series. Electronics And Communication Engineering Maximum Likelihood estimation of different densities
Material type: Computer file Computer file; Format: electronic
Publication details: Bangalore Indian Insitiute of Science
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36.
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Pattern Recognition: "Bayesian estimation of parameters of density functions, MAP estimates" / P.S. Sastry by Series: NPTEL Lecture Series. Electronics And Communication Engineering "Bayesian estimation of parameters of density functions, MAP estimates"
Material type: Computer file Computer file; Format: electronic
Publication details: Bangalore Indian Insitiute of Science
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37.
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Pattern Recognition: Bayesian Estimation examples; the exponential family of densities and ML estimates / P.S. Sastry by Series: NPTEL Lecture Series. Electronics And Communication Engineering Bayesian Estimation examples; the exponential family of densities and ML estimates
Material type: Computer file Computer file; Format: electronic
Publication details: Bangalore Indian Insitiute of Science
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38.
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Pattern Recognition: Sufficient Statistics; Recursive formulation of ML and Bayesian estimates / P.S. Sastry by Series: NPTEL Lecture Series. Electronics And Communication Engineering Sufficient Statistics; Recursive formulation of ML and Bayesian estimates
Material type: Computer file Computer file; Format: electronic
Publication details: Bangalore Indian Insitiute of Science
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39.
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Pattern Recognition: "Mixture Densities, ML estimation and EM algorithm" / P.S. Sastry by Series: NPTEL Lecture Series. Electronics And Communication Engineering "Mixture Densities, ML estimation and EM algorithm"
Material type: Computer file Computer file; Format: electronic
Publication details: Bangalore Indian Insitiute of Science
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40.
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Pattern Recognition: Convergence of EM algorithm; overview of Nonparametric density estimation / P.S. Sastry by Series: NPTEL Lecture Series. Electronics And Communication Engineering Convergence of EM algorithm; overview of Nonparametric density estimation
Material type: Computer file Computer file; Format: electronic
Publication details: Bangalore Indian Insitiute of Science
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