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4481.
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Design Verification and Test of Digital VLSI Circuits: Fault Simulation-2 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Fault Simulation-2
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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4482.
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Design Verification and Test of Digital VLSI Circuits: Fault Simulation-3 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Fault Simulation-3
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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4483.
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Design Verification and Test of Digital VLSI Circuits: Testability Measures (SCOAP) / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Testability Measures (SCOAP)
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Publication details: Guwahati Indian Insitiute of Technology
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4484.
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Design Verification and Test of Digital VLSI Circuits: Introduction to Automatic Test Pattern Generation (ATPG) and ATPG Algebras / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Introduction to Automatic Test Pattern Generation (ATPG) and ATPG Algebras
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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4485.
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Design Verification and Test of Digital VLSI Circuits: D-Algorithm-1 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering D-Algorithm-1
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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4486.
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Design Verification and Test of Digital VLSI Circuits: D-Algorithm-2 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering D-Algorithm-2
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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4487.
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Design Verification and Test of Digital VLSI Circuits: ATPG for Synchronous Sequential Circuits / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering ATPG for Synchronous Sequential Circuits
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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4488.
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Design Verification and Test of Digital VLSI Circuits: Scan Chain based Sequential Circuit Testing-1 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Scan Chain based Sequential Circuit Testing-1
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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4489.
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Design Verification and Test of Digital VLSI Circuits: Scan Chain based Sequential Circuit Testing-2 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Scan Chain based Sequential Circuit Testing-2
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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4490.
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Design Verification and Test of Digital VLSI Circuits: Built in Self Test-1 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Built in Self Test-1
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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4491.
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Design Verification and Test of Digital VLSI Circuits: Built in Self Test-2 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Built in Self Test-2
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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4492.
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Design Verification and Test of Digital VLSI Circuits: Memory Testing-1 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Memory Testing-1
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Publication details: Guwahati Indian Insitiute of Technology
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4493.
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Design Verification and Test of Digital VLSI Circuits: Memory Testing-2 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Memory Testing-2
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Publication details: Guwahati Indian Insitiute of Technology
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4494.
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Biometrics: Lecture-1 / Phalguni Gupta by Series: NPTEL Lecture Series. Computer Science and Engineering Biometrics 01
Material type: Computer file Computer file; Format: electronic
Publication details: Kanpur Indian Insitiute of Technology
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4495.
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Biometrics: Lecture-2 / Phalguni Gupta by Series: NPTEL Lecture Series. Computer Science and Engineering Biometrics 02
Material type: Computer file Computer file; Format: electronic
Publication details: Kanpur Indian Insitiute of Technology
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4496.
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Biometrics: Lecture-3 / Phalguni Gupta by Series: NPTEL Lecture Series. Computer Science and Engineering Biometrics 03
Material type: Computer file Computer file; Format: electronic
Publication details: Kanpur Indian Insitiute of Technology
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4497.
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Biometrics: Lecture-4 / Phalguni Gupta by Series: NPTEL Lecture Series. Computer Science and Engineering Biometrics 04
Material type: Computer file Computer file; Format: electronic
Publication details: Kanpur Indian Insitiute of Technology
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4498.
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Biometrics: Lecture-5 / Phalguni Gupta by Series: NPTEL Lecture Series. Computer Science and Engineering Biometrics 05
Material type: Computer file Computer file; Format: electronic
Publication details: Kanpur Indian Insitiute of Technology
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4499.
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Biometrics: Lecture-6 / Phalguni Gupta by Series: NPTEL Lecture Series. Computer Science and Engineering Biometrics 06
Material type: Computer file Computer file; Format: electronic
Publication details: Kanpur Indian Insitiute of Technology
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4500.
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Biometrics: Lecture-7 / Phalguni Gupta by Series: NPTEL Lecture Series. Computer Science and Engineering Biometrics 07
Material type: Computer file Computer file; Format: electronic
Publication details: Kanpur Indian Insitiute of Technology
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