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5341.
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Design Verification and Test of Digital VLSI Circuits: Fault Simulation-3 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Fault Simulation-3
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

5342.
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Design Verification and Test of Digital VLSI Circuits: Testability Measures (SCOAP) / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Testability Measures (SCOAP)
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

5343.
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Design Verification and Test of Digital VLSI Circuits: Introduction to Automatic Test Pattern Generation (ATPG) and ATPG Algebras / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Introduction to Automatic Test Pattern Generation (ATPG) and ATPG Algebras
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

5344.
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Design Verification and Test of Digital VLSI Circuits: D-Algorithm-1 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering D-Algorithm-1
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

5345.
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Design Verification and Test of Digital VLSI Circuits: D-Algorithm-2 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering D-Algorithm-2
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

5346.
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Design Verification and Test of Digital VLSI Circuits: ATPG for Synchronous Sequential Circuits / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering ATPG for Synchronous Sequential Circuits
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

5347.
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Design Verification and Test of Digital VLSI Circuits: Scan Chain based Sequential Circuit Testing-1 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Scan Chain based Sequential Circuit Testing-1
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

5348.
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Design Verification and Test of Digital VLSI Circuits: Scan Chain based Sequential Circuit Testing-2 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Scan Chain based Sequential Circuit Testing-2
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

5349.
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Design Verification and Test of Digital VLSI Circuits: Built in Self Test-1 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Built in Self Test-1
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

5350.
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Design Verification and Test of Digital VLSI Circuits: Built in Self Test-2 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Built in Self Test-2
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

5351.
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Design Verification and Test of Digital VLSI Circuits: Memory Testing-1 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Memory Testing-1
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

5352.
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Design Verification and Test of Digital VLSI Circuits: Memory Testing-2 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Memory Testing-2
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

5353.
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Biometrics: Lecture-1 / Phalguni Gupta by Series: NPTEL Lecture Series. Computer Science and Engineering Biometrics 01
Material type: Computer file Computer file; Format: electronic
Publication details: Kanpur Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

5354.
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Biometrics: Lecture-2 / Phalguni Gupta by Series: NPTEL Lecture Series. Computer Science and Engineering Biometrics 02
Material type: Computer file Computer file; Format: electronic
Publication details: Kanpur Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

5355.
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Biometrics: Lecture-3 / Phalguni Gupta by Series: NPTEL Lecture Series. Computer Science and Engineering Biometrics 03
Material type: Computer file Computer file; Format: electronic
Publication details: Kanpur Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

5356.
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Biometrics: Lecture-4 / Phalguni Gupta by Series: NPTEL Lecture Series. Computer Science and Engineering Biometrics 04
Material type: Computer file Computer file; Format: electronic
Publication details: Kanpur Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

5357.
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Biometrics: Lecture-5 / Phalguni Gupta by Series: NPTEL Lecture Series. Computer Science and Engineering Biometrics 05
Material type: Computer file Computer file; Format: electronic
Publication details: Kanpur Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

5358.
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Biometrics: Lecture-6 / Phalguni Gupta by Series: NPTEL Lecture Series. Computer Science and Engineering Biometrics 06
Material type: Computer file Computer file; Format: electronic
Publication details: Kanpur Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

5359.
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Biometrics: Lecture-7 / Phalguni Gupta by Series: NPTEL Lecture Series. Computer Science and Engineering Biometrics 07
Material type: Computer file Computer file; Format: electronic
Publication details: Kanpur Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).

5360.
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Biometrics: Lecture-8 / Phalguni Gupta by Series: NPTEL Lecture Series. Computer Science and Engineering Biometrics 08
Material type: Computer file Computer file; Format: electronic
Publication details: Kanpur Indian Insitiute of Technology
Online resources:
Availability: Items available for loan: SNU LIBRARY (1).


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