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5481.
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Design Verification and Test of Digital VLSI Circuits: Syntax and Semantics of CTL � Continued / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Syntax and Semantics of CTL � Continued
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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5482.
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Design Verification and Test of Digital VLSI Circuits: Equivalence between CTL Formulas / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Equivalence between CTL Formulas
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Publication details: Guwahati Indian Insitiute of Technology
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5483.
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Design Verification and Test of Digital VLSI Circuits: Introduction to Model Checking / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Introduction to Model Checking
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Publication details: Guwahati Indian Insitiute of Technology
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5484.
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Design Verification and Test of Digital VLSI Circuits: Model Checking Algorithms I / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Model Checking Algorithms I
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Publication details: Guwahati Indian Insitiute of Technology
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5485.
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Design Verification and Test of Digital VLSI Circuits: Model Checking Algorithms II / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Model Checking Algorithms II
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Publication details: Guwahati Indian Insitiute of Technology
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5486.
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Design Verification and Test of Digital VLSI Circuits: Model Checking with Fairness / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Model Checking with Fairness
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Publication details: Guwahati Indian Insitiute of Technology
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5487.
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Design Verification and Test of Digital VLSI Circuits: Binary Decision Diagram: Introduction and construction / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Binary Decision Diagram: Introduction and construction
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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5488.
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Design Verification and Test of Digital VLSI Circuits: Ordered Binary Decision Diagram / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Ordered Binary Decision Diagram
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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5489.
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Design Verification and Test of Digital VLSI Circuits: Operation on Ordered Binary Decision Diagram / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Operation on Ordered Binary Decision Diagram
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Publication details: Guwahati Indian Insitiute of Technology
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5490.
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Design Verification and Test of Digital VLSI Circuits: Ordered Binary Decision Diagram for State Transition Systems / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Ordered Binary Decision Diagram for State Transition Systems
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5491.
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Design Verification and Test of Digital VLSI Circuits: Symbolic Model Checking / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Symbolic Model Checking
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5492.
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Design Verification and Test of Digital VLSI Circuits: Introduction to Digital VLSI Testing / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Introduction to Digital VLSI Testing
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Publication details: Guwahati Indian Insitiute of Technology
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5493.
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Design Verification and Test of Digital VLSI Circuits: Functional and Structural Testing / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Functional and Structural Testing
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Publication details: Guwahati Indian Insitiute of Technology
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5494.
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Design Verification and Test of Digital VLSI Circuits: Fault Equivalence / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Fault Equivalence
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5495.
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Design Verification and Test of Digital VLSI Circuits: Fault Simulation-1 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Fault Simulation-1
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Publication details: Guwahati Indian Insitiute of Technology
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5496.
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Design Verification and Test of Digital VLSI Circuits: Fault Simulation-2 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Fault Simulation-2
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Publication details: Guwahati Indian Insitiute of Technology
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5497.
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Design Verification and Test of Digital VLSI Circuits: Fault Simulation-3 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Fault Simulation-3
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Publication details: Guwahati Indian Insitiute of Technology
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5498.
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Design Verification and Test of Digital VLSI Circuits: Testability Measures (SCOAP) / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Testability Measures (SCOAP)
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5499.
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Design Verification and Test of Digital VLSI Circuits: Introduction to Automatic Test Pattern Generation (ATPG) and ATPG Algebras / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Introduction to Automatic Test Pattern Generation (ATPG) and ATPG Algebras
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5500.
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Design Verification and Test of Digital VLSI Circuits: D-Algorithm-1 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering D-Algorithm-1
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Publication details: Guwahati Indian Insitiute of Technology
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