Results of search for 'ccl=su:"testing"'

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81.	Image from Amazon.com Image from Google Jackets	The spin model checker : primer and reference manual / Holzmann, Gerard J. by Holzmann, Gerard J Material type: Text; Format: print ; Literary form: Not fiction Publisher number: HCL Publication details: Boston ; Addison-Wesley, , ©2004 Availability: Not available: SNU LIBRARY: Withdrawn (1). Save to lists Add to cart (remove)
82.	Image from Amazon.com Image from Google Jackets	Pragmatic unit testing : in Java with JUnit / Hunt, Andrew. by Hunt, Andrew. Thomas, David Material type: Text; Format: print ; Literary form: Not fiction Publisher number: HCL Publication details: Raleigh, N.C. ; Pragmatic Bookshelf, , ©2004 Availability: Not available: SNU LIBRARY: Withdrawn (2). Save to lists Add to cart (remove)
83.	Image from Amazon.com Image from Google Jackets	The board designer's guide to testable logic circuits / Colin Maunder by Maunder, Colin Material type: Text; Format: print ; Literary form: Not fiction Publisher number: HCL Publication details: Reading, Mass. : Addison-Wesley Pub. Co., ©1992 Availability: Items available for loan: SNU LIBRARY (1)Call number: 621.395 MAU. Place hold Save to lists Add to cart (remove)
84.	Image from Amazon.com Image from Google Jackets	Introducing Software Testing A practical guide to Getting Started Louise Tamres by Tamres,Louise Material type: Text; Format: print ; Literary form: Not fiction Publisher number: Allied Publisher and Distributor Chennai Publication details: New Delhi Pearson 2011- Availability: Items available for loan: SNU LIBRARY (1)Call number: 005.14 TAM. Not available: SNU LIBRARY: Withdrawn (2). Place hold Save to lists Add to cart (remove)
85.	Image from Amazon.com Image from Google Jackets	Digital systems testing and testable design / Miron Abramovici; Melvin A Breuer; Arthur D Friedman by Abramovici, Miron ; Breuer, Melvin A. ; Friedman, Arthur D Edition: revised printing. Material type: Text; Format: print ; Literary form: Not fiction Publisher number: Global Alliance Book Distributors A-312, Nanad Nikunj Meerut Road, Ghaziabad, U.P.-201001 HCL Publication details: New Jersey. : IEEE, Wiley Interscience., 1990 Availability: Items available for loan: SNU LIBRARY (1)Call number: 621.3815 ABR. Place hold Save to lists Add to cart (remove)
86.	Image from Google Jackets	Component-based software testing with UML / Hans-Gerhard Gross by Gross, Hans-Gerhard Material type: Text; Format: print ; Literary form: Not fiction Publisher number: HCL Publication details: Berlin Springer 2005 Availability: Not available: SNU LIBRARY: Withdrawn (1). Save to lists Add to cart (remove)
87.	Image from Amazon.com Image from Google Jackets	Automated software testing : introduction, management, and performance / Elfriede Dustin...[et al] by Dustin, Elfriede...[et al] Material type: Text; Format: print ; Literary form: Not fiction Publisher number: HCL Publication details: Reading, Mass. : Addison-Wesley, 1999 Availability: Not available: SNU LIBRARY: Withdrawn (1). Save to lists Add to cart (remove)
88.	Image from Amazon.com Image from Google Jackets	Testing computer telephony systems and networks / Steve Gladstone by Gladstone, Steve Edition: 2nd ed. Material type: Text; Format: print ; Literary form: Not fiction Publisher number: HCL Publication details: New York : Flatiron , ©1996 Availability: Not available: SNU LIBRARY: Withdrawn (1). Save to lists Add to cart (remove)
89.	Image from Amazon.com Image from Google Jackets	Software testing tools : covering WinRunner, SilkTest, LoadRunner,JMeter, TestDirector and QTP with case studies / K V K K Prasad by K V K K Prasad Material type: Text; Format: print ; Literary form: Not fiction Publisher number: HCL Publication details: New Delhi : DreamTech Press , 2005, ©2004 Availability: Not available: SNU LIBRARY: Withdrawn (3). Save to lists Add to cart (remove)
90.	Image from Amazon.com Image from Google Jackets	Testing semiconductor memories : theory and practice / A J van de Goor by A J van de Goor Material type: Text; Format: print ; Literary form: Not fiction Publisher number: HCL Publication details: Chichester ; New York : J. Wiley & Sons 1991 Availability: Not available: SNU LIBRARY: Withdrawn (1). Save to lists Add to cart (remove)
91.	Image from Google Jackets	Digital Signal Processing: Characterization, Description, Testing of Digital Systems / S.C. Dutta Roy by Roy, S.C. Dutta Series: NPTEL Lecture Series \| . Electronics And Communication Engineering \| . Characterization, Description, Testing of Digital Systems Material type: Text; Format: print ; Literary form: Not fiction Publication details: Delhi ; Indian Insitiute of Technology Online resources: Click here to access online Availability: No items available. Save to lists Add to cart (remove)
92.	Image from Google Jackets	Probability Methods in Civil Engineering: Hypothesis Testing / Rajib Maity by Maity, Rajib Series: NPTEL Lecture Series \| . Civil Engineering \| . Hypothesis Testing Material type: Text; Format: print ; Literary form: Not fiction Publication details: Kharagpur ; Indian Insitiute of Technology Online resources: Click here to access online Availability: No items available. Save to lists Add to cart (remove)
93.	Image from Google Jackets	Digital Signal Processing: Characterization, Description, Testing of Digital Systems / S.C. Dutta Roy by Roy, S.C. Dutta Series: NPTEL Lecture Series. Electronics And Communication Engineering Characterization, Description, Testing of Digital Systems Material type: Text; Format: print ; Literary form: Not fiction Publication details: Delhi Indian Insitiute of Technology Online resources: Video Availability: Items available for loan: SNU LIBRARY (1). Place hold Save to lists Add to cart (remove)
94.	Image from Google Jackets	Probability Methods in Civil Engineering: Hypothesis Testing / Rajib Maity by Maity, Rajib Series: NPTEL Lecture Series. Civil Engineering Hypothesis Testing Material type: Computer file; Format: electronic Publication details: Kharagpur Indian Insitiute of Technology Online resources: Video Availability: Items available for loan: SNU LIBRARY (1). Place hold Save to lists Add to cart (remove)
95.	Image from Amazon.com Image from Google Jackets	A structured approach to systems testing / William E. Perry by Perry, William E Material type: Text; Format: print ; Literary form: Not fiction Publisher number: HCL Publication details: Wellesley, MA. QED Information Sciences 1983 Availability: Not available: SNU LIBRARY: Withdrawn (1). Save to lists Add to cart (remove)
96.	Image from Amazon.com Image from Google Jackets	Tutorial : software quality assurance : a practical approach / Tsun S. Chow by Chow, Tsun S. IEEE Computer Society Material type: Text; Format: print ; Literary form: Not fiction Publisher number: HCL Publication details: Silver Spring, MD IEEE Computer Society Press 1985 Availability: Not available: SNU LIBRARY: Withdrawn (1). Save to lists Add to cart (remove)
97.	Image from Google Jackets	Design Verification and Test of Digital VLSI Circuits: Introduction to Digital VLSI Testing / Jatindra Kumar Deka and Santosh Biswas by "Biswas, Santosh" "Deka, Jatindra Kumar" Series: NPTEL Lecture Series. Computer Science and Engineering Introduction to Digital VLSI Testing Material type: Computer file; Format: electronic Publication details: Guwahati Indian Insitiute of Technology Online resources: Video Availability: Items available for loan: SNU LIBRARY (1). Place hold Save to lists Add to cart (remove)
98.	Image from Google Jackets	Design Verification and Test of Digital VLSI Circuits: Functional and Structural Testing / Jatindra Kumar Deka and Santosh Biswas by "Biswas, Santosh" "Deka, Jatindra Kumar" Series: NPTEL Lecture Series. Computer Science and Engineering Functional and Structural Testing Material type: Computer file; Format: electronic Publication details: Guwahati Indian Insitiute of Technology Online resources: Video Availability: Items available for loan: SNU LIBRARY (1). Place hold Save to lists Add to cart (remove)
99.	Image from Google Jackets	Design Verification and Test of Digital VLSI Circuits: Scan Chain based Sequential Circuit Testing-1 / Jatindra Kumar Deka and Santosh Biswas by "Biswas, Santosh" "Deka, Jatindra Kumar" Series: NPTEL Lecture Series. Computer Science and Engineering Scan Chain based Sequential Circuit Testing-1 Material type: Computer file; Format: electronic Publication details: Guwahati Indian Insitiute of Technology Online resources: Video Availability: Items available for loan: SNU LIBRARY (1). Place hold Save to lists Add to cart (remove)
100.	Image from Google Jackets	Design Verification and Test of Digital VLSI Circuits: Scan Chain based Sequential Circuit Testing-2 / Jatindra Kumar Deka and Santosh Biswas by "Biswas, Santosh" "Deka, Jatindra Kumar" Series: NPTEL Lecture Series. Computer Science and Engineering Scan Chain based Sequential Circuit Testing-2 Material type: Computer file; Format: electronic Publication details: Guwahati Indian Insitiute of Technology Online resources: Video Availability: Items available for loan: SNU LIBRARY (1). Place hold Save to lists Add to cart (remove)