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261.
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Design Verification and Test of Digital VLSI Circuits: Ordered Binary Decision Diagram for State Transition Systems / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Ordered Binary Decision Diagram for State Transition Systems
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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262.
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Design Verification and Test of Digital VLSI Circuits: Symbolic Model Checking / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Symbolic Model Checking
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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263.
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Design Verification and Test of Digital VLSI Circuits: Introduction to Digital VLSI Testing / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Introduction to Digital VLSI Testing
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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264.
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Design Verification and Test of Digital VLSI Circuits: Functional and Structural Testing / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Functional and Structural Testing
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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265.
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Design Verification and Test of Digital VLSI Circuits: Fault Equivalence / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Fault Equivalence
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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266.
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Design Verification and Test of Digital VLSI Circuits: Fault Simulation-1 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Fault Simulation-1
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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267.
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Design Verification and Test of Digital VLSI Circuits: Fault Simulation-2 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Fault Simulation-2
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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268.
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Design Verification and Test of Digital VLSI Circuits: Fault Simulation-3 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Fault Simulation-3
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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269.
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Design Verification and Test of Digital VLSI Circuits: Testability Measures (SCOAP) / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Testability Measures (SCOAP)
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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270.
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Design Verification and Test of Digital VLSI Circuits: Introduction to Automatic Test Pattern Generation (ATPG) and ATPG Algebras / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Introduction to Automatic Test Pattern Generation (ATPG) and ATPG Algebras
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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271.
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Design Verification and Test of Digital VLSI Circuits: D-Algorithm-1 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering D-Algorithm-1
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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272.
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Design Verification and Test of Digital VLSI Circuits: D-Algorithm-2 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering D-Algorithm-2
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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273.
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Design Verification and Test of Digital VLSI Circuits: ATPG for Synchronous Sequential Circuits / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering ATPG for Synchronous Sequential Circuits
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Publication details: Guwahati Indian Insitiute of Technology
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274.
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Design Verification and Test of Digital VLSI Circuits: Scan Chain based Sequential Circuit Testing-1 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Scan Chain based Sequential Circuit Testing-1
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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275.
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Design Verification and Test of Digital VLSI Circuits: Scan Chain based Sequential Circuit Testing-2 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Scan Chain based Sequential Circuit Testing-2
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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276.
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Design Verification and Test of Digital VLSI Circuits: Built in Self Test-1 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Built in Self Test-1
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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277.
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Design Verification and Test of Digital VLSI Circuits: Built in Self Test-2 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Built in Self Test-2
Material type: Computer file Computer file; Format: electronic
Publication details: Guwahati Indian Insitiute of Technology
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278.
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Design Verification and Test of Digital VLSI Circuits: Memory Testing-1 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Memory Testing-1
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Publication details: Guwahati Indian Insitiute of Technology
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279.
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Design Verification and Test of Digital VLSI Circuits: Memory Testing-2 / Jatindra Kumar Deka and Santosh Biswas by Series: NPTEL Lecture Series. Computer Science and Engineering Memory Testing-2
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Publication details: Guwahati Indian Insitiute of Technology
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280.
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Low Power VLSI Circuits And Systems: Inroduction and Course outline / Ajit Pal by Series: NPTEL Lecture Series. Computer Science and Engineering Inroduction and Course outline
Material type: Computer file Computer file; Format: electronic
Publication details: Kharagpur Indian Insitiute of Technology
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