MARC details
| 000 -LEADER |
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| fixed length control field |
03476nam a22003977a 4500 |
| 003 - CONTROL NUMBER IDENTIFIER |
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| control field |
SNU |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
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| control field |
20160510234509.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
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| fixed length control field |
160413b xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
9781782422211 |
| 028 ## - Distributer Name & Address |
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| Distributor Name |
Global Information Systems Technology Pvt Ltd |
| Distributor Address |
877, Udhyog Vihar, Phase-V, Gurgaon |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
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| Classification number |
621.381 SWI |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
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| Personal name |
Swingler, J. |
| 245 ## - TITLE STATEMENT |
|---|
| Title |
Reliability characterisation of electrical and electronic systems / |
| Statement of responsibility, etc |
J Swingler. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
|---|
| Place of publication, distribution, etc |
Amsterdam ; |
| Name of publisher, distributor, etc |
Elsevier/Academic Press, |
| Date of publication, distribution, etc |
©2015 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xxiv, 257 pages : |
| Other physical details |
illustrations ; |
| Dimensions |
24 cm. |
| 505 ## - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
1 - Introduction, |
| Uniform Resource Identifier |
http://www.sciencedirect.com/science/article/pii/B9781782422211000010 |
| 505 ## - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
2 - Reliability and stupidity: mistakes in reliability engineering and how to avoid them, |
| Uniform Resource Identifier |
http://www.sciencedirect.com/science/article/pii/B9781782422211000022 |
| 505 ## - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
3 - Physics-of-failure (PoF) methodology for electronic reliability, |
| Uniform Resource Identifier |
http://www.sciencedirect.com/science/article/pii/B9781782422211000034 |
| 505 ## - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
4 - Modern instruments for characterizing degradation in electrical and electronic equipment, |
| Uniform Resource Identifier |
http://www.sciencedirect.com/science/article/pii/B9781782422211000046 |
| 505 ## - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
5 - Reliability building of discrete electronic components, |
| Uniform Resource Identifier |
http://www.sciencedirect.com/science/article/pii/B9781782422211000058 |
| 505 ## - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
6 - Reliability of optoelectronics, |
| Uniform Resource Identifier |
http://www.sciencedirect.com/science/article/pii/B978178242221100006X |
| 505 ## - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
7 - Reliability of silicon integrated circuits, |
| Uniform Resource Identifier |
http://www.sciencedirect.com/science/article/pii/B9781782422211000071 |
| 505 ## - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
8 - Reliability of emerging nanodevices, |
| Uniform Resource Identifier |
http://www.sciencedirect.com/science/article/pii/B9781782422211000083 |
| 505 ## - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
9 - Design considerations for reliable embedded systems, |
| Uniform Resource Identifier |
http://www.sciencedirect.com/science/article/pii/B9781782422211000095 |
| 505 ## - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
10 - Reliability approaches for automotive electronic systems, |
| Uniform Resource Identifier |
http://www.sciencedirect.com/science/article/pii/B9781782422211000101 |
| 505 ## - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
11 - Reliability modeling and accelerated life testing for solar power generation systems, |
| Uniform Resource Identifier |
http://www.sciencedirect.com/science/article/pii/B9781782422211000113 |
| Miscellaneous information |
Chapter 12 - Future Directions and Reliability Issues, http://www.sciencedirect.com/science/article/pii/B9780120885749000124 |
| 520 ## - SUMMARY, ETC. |
|---|
| Summary, etc |
This book takes a holistic approach to reliability engineering for electrical and electronic systems by looking at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability for a range of devices. The text describes the reliability behavior of electrical and electronic systems. It takes an empirical scientific approach to reliability engineering to facilitate a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation. After introducing the fundamentals and background to reliability theory, the text moves on to describe the methods of reliability analysis and charactersation across a wide range of applications. |
| Uniform Resource Identifier |
http://www.sciencedirect.com/science/book/9781782422211 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Reliability |
| Source of heading or term |
|
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
stupidity |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Physics-of-failure (PoF) |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
electrical and electronic |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
discrete electronic |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
E-Books |
| 856 ## - ELECTRONIC LOCATION AND ACCESS |
|---|
| Materials specified |
E-Book |
| Uniform Resource Identifier |
http://www.sciencedirect.com/science/book/9781782422211 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Source of classification or shelving scheme |
|
| Koha item type |
Electronic Resources (E-Books) |
