Reliability characterisation of electrical and electronic systems / J Swingler.
Material type: TextPublisher number: Global Information Systems Technology Pvt Ltd | 877, Udhyog Vihar, Phase-V, GurgaonPublication details: Amsterdam ; Elsevier/Academic Press, ©2015Description: xxiv, 257 pages : illustrations ; 24 cmISBN: 9781782422211Subject(s): Reliability | stupidity | Physics-of-failure (PoF) | electrical and electronic | discrete electronic | E-BooksDDC classification: 621.381 SWI Online resources: E-BookItem type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds |
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Electronic Resources (E-Books) | SNU LIBRARY | Reference | 621.381 SWI (Browse shelf(Opens below)) | Not For Loan | ER31 |
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1 - Introduction,
http://www.sciencedirect.com/science/article/pii/B9781782422211000010
2 - Reliability and stupidity: mistakes in reliability engineering and how to avoid them,
http://www.sciencedirect.com/science/article/pii/B9781782422211000022
3 - Physics-of-failure (PoF) methodology for electronic reliability,
http://www.sciencedirect.com/science/article/pii/B9781782422211000034
4 - Modern instruments for characterizing degradation in electrical and electronic equipment,
http://www.sciencedirect.com/science/article/pii/B9781782422211000046
5 - Reliability building of discrete electronic components,
http://www.sciencedirect.com/science/article/pii/B9781782422211000058
6 - Reliability of optoelectronics,
http://www.sciencedirect.com/science/article/pii/B978178242221100006X
7 - Reliability of silicon integrated circuits,
http://www.sciencedirect.com/science/article/pii/B9781782422211000071
8 - Reliability of emerging nanodevices,
http://www.sciencedirect.com/science/article/pii/B9781782422211000083
9 - Design considerations for reliable embedded systems,
http://www.sciencedirect.com/science/article/pii/B9781782422211000095
10 - Reliability approaches for automotive electronic systems,
http://www.sciencedirect.com/science/article/pii/B9781782422211000101
11 - Reliability modeling and accelerated life testing for solar power generation systems, Chapter 12 - Future Directions and Reliability Issues, http://www.sciencedirect.com/science/article/pii/B9780120885749000124
http://www.sciencedirect.com/science/article/pii/B9781782422211000113
This book takes a holistic approach to reliability engineering for electrical and electronic systems by looking at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability for a range of devices. The text describes the reliability behavior of electrical and electronic systems. It takes an empirical scientific approach to reliability engineering to facilitate a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation. After introducing the fundamentals and background to reliability theory, the text moves on to describe the methods of reliability analysis and charactersation across a wide range of applications.
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