Reliability characterisation of electrical and electronic systems / J Swingler.

By: Swingler, JMaterial type: TextTextPublisher number: Global Information Systems Technology Pvt Ltd | 877, Udhyog Vihar, Phase-V, GurgaonPublication details: Amsterdam ; Elsevier/Academic Press, ©2015Description: xxiv, 257 pages : illustrations ; 24 cmISBN: 9781782422211Subject(s): Reliability | stupidity | Physics-of-failure (PoF) | electrical and electronic | discrete electronic | E-BooksDDC classification: 621.381 SWI Online resources: E-Book
Contents:
1 - Introduction, http://www.sciencedirect.com/science/article/pii/B9781782422211000010
2 - Reliability and stupidity: mistakes in reliability engineering and how to avoid them, http://www.sciencedirect.com/science/article/pii/B9781782422211000022
3 - Physics-of-failure (PoF) methodology for electronic reliability, http://www.sciencedirect.com/science/article/pii/B9781782422211000034
4 - Modern instruments for characterizing degradation in electrical and electronic equipment, http://www.sciencedirect.com/science/article/pii/B9781782422211000046
5 - Reliability building of discrete electronic components, http://www.sciencedirect.com/science/article/pii/B9781782422211000058
6 - Reliability of optoelectronics, http://www.sciencedirect.com/science/article/pii/B978178242221100006X
7 - Reliability of silicon integrated circuits, http://www.sciencedirect.com/science/article/pii/B9781782422211000071
8 - Reliability of emerging nanodevices, http://www.sciencedirect.com/science/article/pii/B9781782422211000083
9 - Design considerations for reliable embedded systems, http://www.sciencedirect.com/science/article/pii/B9781782422211000095
10 - Reliability approaches for automotive electronic systems, http://www.sciencedirect.com/science/article/pii/B9781782422211000101
11 - Reliability modeling and accelerated life testing for solar power generation systems, http://www.sciencedirect.com/science/article/pii/B9781782422211000113 Chapter 12 - Future Directions and Reliability Issues, http://www.sciencedirect.com/science/article/pii/B9780120885749000124
Summary: This book takes a holistic approach to reliability engineering for electrical and electronic systems by looking at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability for a range of devices. The text describes the reliability behavior of electrical and electronic systems. It takes an empirical scientific approach to reliability engineering to facilitate a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation. After introducing the fundamentals and background to reliability theory, the text moves on to describe the methods of reliability analysis and charactersation across a wide range of applications. http://www.sciencedirect.com/science/book/9781782422211
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Holdings
Item type Current library Collection Call number Status Date due Barcode Item holds
Electronic Resources (E-Books) Electronic Resources (E-Books) SNU LIBRARY
Reference 621.381 SWI (Browse shelf(Opens below)) Not For Loan ER31
Total holds: 0

1 - Introduction,

http://www.sciencedirect.com/science/article/pii/B9781782422211000010

2 - Reliability and stupidity: mistakes in reliability engineering and how to avoid them,

http://www.sciencedirect.com/science/article/pii/B9781782422211000022

3 - Physics-of-failure (PoF) methodology for electronic reliability,

http://www.sciencedirect.com/science/article/pii/B9781782422211000034

4 - Modern instruments for characterizing degradation in electrical and electronic equipment,

http://www.sciencedirect.com/science/article/pii/B9781782422211000046

5 - Reliability building of discrete electronic components,

http://www.sciencedirect.com/science/article/pii/B9781782422211000058

6 - Reliability of optoelectronics,

http://www.sciencedirect.com/science/article/pii/B978178242221100006X

7 - Reliability of silicon integrated circuits,

http://www.sciencedirect.com/science/article/pii/B9781782422211000071

8 - Reliability of emerging nanodevices,

http://www.sciencedirect.com/science/article/pii/B9781782422211000083

9 - Design considerations for reliable embedded systems,

http://www.sciencedirect.com/science/article/pii/B9781782422211000095

10 - Reliability approaches for automotive electronic systems,

http://www.sciencedirect.com/science/article/pii/B9781782422211000101

11 - Reliability modeling and accelerated life testing for solar power generation systems, Chapter 12 - Future Directions and Reliability Issues, http://www.sciencedirect.com/science/article/pii/B9780120885749000124

http://www.sciencedirect.com/science/article/pii/B9781782422211000113

This book takes a holistic approach to reliability engineering for electrical and electronic systems by looking at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability for a range of devices. The text describes the reliability behavior of electrical and electronic systems. It takes an empirical scientific approach to reliability engineering to facilitate a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation. After introducing the fundamentals and background to reliability theory, the text moves on to describe the methods of reliability analysis and charactersation across a wide range of applications.

http://www.sciencedirect.com/science/book/9781782422211

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