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IEEE Standard Test Access Port and Boundary-Scan Architecture /The Institute of Electrical and Electronics Engineers
Material type:
TextPublication details: .-USA : Inst of Elect & Electronic ,@1993Description: 176p.;15cm. SoftocverISBN: - 1559373504
- 621.38152 IEE
| Item type | Current library | Call number | Status | Barcode | |
|---|---|---|---|---|---|
HCL Collection
|
SNU LIBRARY | 621.38152 IEE (Browse shelf(Opens below)) | Withdrawn | H14299 |
Total holds: 0
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