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To identify potential scan chain failure due to dynamic voltage drop. \Manish Kumar Gupta

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Gupta, Manish Kumar

Material type: Text

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TextSeries: .-(M.Tech Electrical Engineering). ,Under Supervision of Dr. Ramesh Vaddi Publication details: .-Shiv Nadar University,Dadri :Department of Electrical Engineering ,May,2015Description: 83 p. , Hard BoundGenre/Form:

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Item type	Current library	Status	Barcode
Project Report	SNU LIBRARY	Available	TH113

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