Reliability and failure of electronic materials and devices /
Ohring, Milton, 1936-
Reliability and failure of electronic materials and devices / Milton Ohring & Lucian Kasprzak. - Amsterdam ; Elsevier/Academic Press, ©2015 - xxiv, 734 pages : illustrations ; 24 cm.
Chapter 1 - An Overview of Electronic Devices and Their Reliability, http://www.sciencedirect.com/science/article/pii/B978012088574900001X Chapter 2 - Electronic Devices: How They Operate and Are Fabricated, http://www.sciencedirect.com/science/article/pii/B9780120885749000021 Chapter 3 - Defects, Contaminants, and Yield, http://www.sciencedirect.com/science/article/pii/B9780120885749000033 Chapter 4 - The Mathematics of Failure and Reliability, http://www.sciencedirect.com/science/article/pii/B9780120885749000045 Chapter 5 - Mass Transport-Induced Failure, http://www.sciencedirect.com/science/article/pii/B9780120885749000057 Chapter 6 - Electronic Charge-Induced Damage, http://www.sciencedirect.com/science/article/pii/B9780120885749000069 Chapter 7 - Environmental Damage to Electronic Products, http://www.sciencedirect.com/science/article/pii/B9780120885749000070 Chapter 8 - Packaging Materials, Processes, and Stresses, http://www.sciencedirect.com/science/article/pii/B9780120885749000082 Chapter 9 - Degradation of Contacts and Package Interconnections, http://www.sciencedirect.com/science/article/pii/B9780120885749000094 Chapter 10 - Degradation and Failure of Electro-Optical Materials and Devices, http://www.sciencedirect.com/science/article/pii/B9780120885749000100 Chapter 11 - Characterization and Failure Analysis of Materials and Devices, Chapter 12 - Future Directions and Reliability Issues, http://www.sciencedirect.com/science/article/pii/B9780120885749000124 http://www.sciencedirect.com/science/article/pii/B9780120885749000112
"Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices http://www.sciencedirect.com/science/book/9780120885749
9780120885749
Global Information Systems Technology Pvt Ltd 877, Udhyog Vihar, Phase-V, Gurgaon
Electronic apparatus and appliances
Reliability.
System failures (Engineering)
Packaging Materials
Electronic Charge-Induced Damage
E-Books
621.381 OHR
Reliability and failure of electronic materials and devices / Milton Ohring & Lucian Kasprzak. - Amsterdam ; Elsevier/Academic Press, ©2015 - xxiv, 734 pages : illustrations ; 24 cm.
Chapter 1 - An Overview of Electronic Devices and Their Reliability, http://www.sciencedirect.com/science/article/pii/B978012088574900001X Chapter 2 - Electronic Devices: How They Operate and Are Fabricated, http://www.sciencedirect.com/science/article/pii/B9780120885749000021 Chapter 3 - Defects, Contaminants, and Yield, http://www.sciencedirect.com/science/article/pii/B9780120885749000033 Chapter 4 - The Mathematics of Failure and Reliability, http://www.sciencedirect.com/science/article/pii/B9780120885749000045 Chapter 5 - Mass Transport-Induced Failure, http://www.sciencedirect.com/science/article/pii/B9780120885749000057 Chapter 6 - Electronic Charge-Induced Damage, http://www.sciencedirect.com/science/article/pii/B9780120885749000069 Chapter 7 - Environmental Damage to Electronic Products, http://www.sciencedirect.com/science/article/pii/B9780120885749000070 Chapter 8 - Packaging Materials, Processes, and Stresses, http://www.sciencedirect.com/science/article/pii/B9780120885749000082 Chapter 9 - Degradation of Contacts and Package Interconnections, http://www.sciencedirect.com/science/article/pii/B9780120885749000094 Chapter 10 - Degradation and Failure of Electro-Optical Materials and Devices, http://www.sciencedirect.com/science/article/pii/B9780120885749000100 Chapter 11 - Characterization and Failure Analysis of Materials and Devices, Chapter 12 - Future Directions and Reliability Issues, http://www.sciencedirect.com/science/article/pii/B9780120885749000124 http://www.sciencedirect.com/science/article/pii/B9780120885749000112
"Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices http://www.sciencedirect.com/science/book/9780120885749
9780120885749
Global Information Systems Technology Pvt Ltd 877, Udhyog Vihar, Phase-V, Gurgaon
Electronic apparatus and appliances
Reliability.
System failures (Engineering)
Packaging Materials
Electronic Charge-Induced Damage
E-Books
621.381 OHR
