Reliability and failure of electronic materials and devices / (Record no. 45969)

MARC details
000 -LEADER
fixed length control field 03634nam a22004097a 4500
003 - CONTROL NUMBER IDENTIFIER
control field SNU
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20160510231811.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 160413b xxu||||| |||| 00| 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780120885749
028 ## - Distributer Name & Address
Distributor Name Global Information Systems Technology Pvt Ltd
Distributor Address 877, Udhyog Vihar, Phase-V, Gurgaon
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.381 OHR
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Ohring, Milton,
Dates associated with a name 1936-
245 ## - TITLE STATEMENT
Title Reliability and failure of electronic materials and devices /
Statement of responsibility, etc Milton Ohring & Lucian Kasprzak.
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc Amsterdam ;
Name of publisher, distributor, etc Elsevier/Academic Press,
Date of publication, distribution, etc ©2015
300 ## - PHYSICAL DESCRIPTION
Extent xxiv, 734 pages :
Other physical details illustrations ;
Dimensions 24 cm.
505 ## - FORMATTED CONTENTS NOTE
Formatted contents note Chapter 1 - An Overview of Electronic Devices and Their Reliability,
Uniform Resource Identifier http://www.sciencedirect.com/science/article/pii/B978012088574900001X
505 ## - FORMATTED CONTENTS NOTE
Formatted contents note Chapter 2 - Electronic Devices: How They Operate and Are Fabricated,
Uniform Resource Identifier http://www.sciencedirect.com/science/article/pii/B9780120885749000021
505 ## - FORMATTED CONTENTS NOTE
Formatted contents note Chapter 3 - Defects, Contaminants, and Yield,
Uniform Resource Identifier http://www.sciencedirect.com/science/article/pii/B9780120885749000033
505 ## - FORMATTED CONTENTS NOTE
Formatted contents note Chapter 4 - The Mathematics of Failure and Reliability,
Uniform Resource Identifier http://www.sciencedirect.com/science/article/pii/B9780120885749000045
505 ## - FORMATTED CONTENTS NOTE
Formatted contents note Chapter 5 - Mass Transport-Induced Failure,
Uniform Resource Identifier http://www.sciencedirect.com/science/article/pii/B9780120885749000057
505 ## - FORMATTED CONTENTS NOTE
Formatted contents note Chapter 6 - Electronic Charge-Induced Damage,
Uniform Resource Identifier http://www.sciencedirect.com/science/article/pii/B9780120885749000069
505 ## - FORMATTED CONTENTS NOTE
Formatted contents note Chapter 7 - Environmental Damage to Electronic Products,
Uniform Resource Identifier http://www.sciencedirect.com/science/article/pii/B9780120885749000070
505 ## - FORMATTED CONTENTS NOTE
Formatted contents note Chapter 8 - Packaging Materials, Processes, and Stresses,
Uniform Resource Identifier http://www.sciencedirect.com/science/article/pii/B9780120885749000082
505 ## - FORMATTED CONTENTS NOTE
Formatted contents note Chapter 9 - Degradation of Contacts and Package Interconnections,
Uniform Resource Identifier http://www.sciencedirect.com/science/article/pii/B9780120885749000094
505 ## - FORMATTED CONTENTS NOTE
Formatted contents note Chapter 10 - Degradation and Failure of Electro-Optical Materials and Devices,
Uniform Resource Identifier http://www.sciencedirect.com/science/article/pii/B9780120885749000100
505 ## - FORMATTED CONTENTS NOTE
Formatted contents note Chapter 11 - Characterization and Failure Analysis of Materials and Devices,
Uniform Resource Identifier http://www.sciencedirect.com/science/article/pii/B9780120885749000112
Miscellaneous information Chapter 12 - Future Directions and Reliability Issues, http://www.sciencedirect.com/science/article/pii/B9780120885749000124
520 ## - SUMMARY, ETC.
Summary, etc "Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices
Uniform Resource Identifier http://www.sciencedirect.com/science/book/9780120885749
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Electronic apparatus and appliances
Source of heading or term
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Reliability.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element System failures (Engineering)
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Packaging Materials
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Electronic Charge-Induced Damage
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element E-Books
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Kasprzak, Lucian.
856 ## - ELECTRONIC LOCATION AND ACCESS
Materials specified E-Book
Uniform Resource Identifier http://www.sciencedirect.com/science/book/9780120885749
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Dewey Decimal Classification
Koha item type Electronic Resources (E-Books)
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Materials specified (bound volume or other part) Damaged status Not for loan Collection code Home library Current library Date acquired Source of acquisition Cost, normal purchase price Total Checkouts Full call number Barcode Date last seen Price effective from Koha item type
    Dewey Decimal Classification Document, Internet resource   Not For Loan Reference SNU LIBRARY SNU LIBRARY 10/05/2016 Science Direct®, (Elsevier) 13650.00   621.381 OHR ER30 10/05/2016 10/05/2016 Electronic Resources (E-Books)

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