Digital systems testing and testable design / Miron Abramovici; Melvin A Breuer; Arthur D Friedman
Material type: TextPublisher number: Global Alliance Book Distributors | A-312, Nanad Nikunj Meerut Road, Ghaziabad, U.P.-201001HCLPublication details: New Jersey. : IEEE, Wiley Interscience., 1990Edition: revised printingDescription: xviii, 652 p. : ill. ; 25 cmISBN: 9780780310629Genre/Form: DDC classification: 621.3815 ABRItem type | Current library | Call number | Status | Date due | Barcode | Item holds |
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HCL Collection | SNU LIBRARY | 621.3815 ABR (Browse shelf(Opens below)) | Available | H5625 |
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621.381335 GIL Microwave Tubes. | 621.381335 GIL Principles of traveling wave tubes. | 621.3815 ABR Digital systems testing and testable design | 621.3815 ABR Digital systems testing and testable design | 621.3815 ADV MOS Microprocessors and Peripherals | 621.3815 ALL CMOS analog circuit design | 621.3815 ALL CMOS analog circuit design |
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