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Metrology, inspection, and process control for microlithography XVIII 23-26 February 2004, Santa Clara, California, USA / Richard M Silver.

By: Material type: TextTextPublisher number: ;HCLPublication details: Santa Clara :SPIE ,2004.Description: xl,720p. :30cmISBN:
  • 0819452882
Genre/Form: DDC classification:
  • 621.381531 SIL
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Holdings
Item type Current library Call number Status Barcode
HCL Collection HCL Collection SNU LIBRARY 621.381531 SIL (Browse shelf(Opens below)) Withdrawn H14201
HCL Collection HCL Collection SNU LIBRARY 621.381531 SIL (Browse shelf(Opens below)) Withdrawn H14202
Total holds: 0

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