Thin film analysis by X-ray scattering. ;Mario Birkholz.

By:

;Birkholz, Mario. ; Fewster,Paul F

Material type: Text

TextPublisher number: ,Variety Books Publishers and Distributors. | ,2/22 Ansari Road New Delhi.Publication details: ,Weinheim , Wiley-VCH ,2006.Description: xxii, 356 p. : ill. ; 25 cmISBN:

9783527310524

Genre/Form:

DDC classification:

530.4275 BIR

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Item type	Current library	Call number	Status	Barcode
Books	SNU LIBRARY	530.4275 BIR (Browse shelf(Opens below))	Available	10957

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