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1.	Image from Amazon.com Image from Google Jackets	Semiconductor memories : technology, testing, and reliability by Sharma, Ashok K. ; IEEE Solid-State Circuits Council Material type: Text; Format: print ; Literary form: Not fiction Publisher number: HCL Publication details: New York ; IEEE Press, ©1997 Availability: Items available for loan: SNU LIBRARY (2)Call number: 621.39732 SHA, ... Place hold Save to lists Add to cart (remove)
2.	Image from Amazon.com Image from Google Jackets	VLSI memory chip design / Kiyoo Itoh by Kiyoo Itoh Material type: Text; Format: print ; Literary form: Not fiction Publisher number: HCL Publication details: Berlin ; New York : Springer , 2001 Availability: Not available: SNU LIBRARY: Withdrawn (1). Save to lists Add to cart (remove)
3.	Image from Amazon.com Image from Google Jackets	Testing semiconductor memories : theory and practice / A J van de Goor by A J van de Goor Material type: Text; Format: print ; Literary form: Not fiction Publisher number: HCL Publication details: Chichester ; New York : J. Wiley & Sons 1991 Availability: Not available: SNU LIBRARY: Withdrawn (1). Save to lists Add to cart (remove)

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